Zobrazeno 1 - 10
of 16
pro vyhledávání: '"Uwe Schuhmann"'
Autor:
Uwe Schuhmann, Jörg Wunderlich, Hans-Jürgen Feige, Lutz Reichmann, Matthias Bening, Helmut Bernitzki, Jürgen Finster, Peter Triebel
Publikováno v:
SPIE Proceedings.
Today’s high brilliance Laser sources cause huge thermal effects on optical components, affecting process stability. This paper shows the holistic approach to the improvement of objective lenses to minimum thermal effects as focus shift. A new appr
Autor:
Adolf Giesen, Rimantas Grigonis, Oswald Wilhelm, Stefan Gliech, Detlef Nickel, Christoph Fleig, Marco Jupé, Wolfgang Riede, Angela Duparré, Kai Starke, Hans Joachim Eichler, Alexandra Haise, Andreas Letsch, Anna Krasilnikova, Michael Schulz-Grosser, Rainer Haspel, Detlev Ristau, Chris Scharfenorth, Valdas Sirutkaitis, Uwe Schuhmann, Ona Balachninaite, Andrea Erhard, Rudolf A. Huber, V S Kazakevich
Publikováno v:
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization.
Within the EUREKA-project EU 2359 (Instruments and Standard Test Procedures for Laser Beam and Optics Characterization) a "Round-Robin"-experiment on reflectivity measurements at the wavelength λ = 1.06 μm has been carried out. The topic of this "R
Autor:
Stefan Gliech, Markus Tilsch, Christian Jolie, Rainer G. Schuhmann, Claude Amra, Detlev Ristau, Norbert Reng, Carole Deumie, Tomas Lindstroem, Carl-Gustaf Ribbing, Uwe Schuhmann, A. Mueller, Helmut Kessler, Angela Duparré, Hans Lauth, Puja Kadkhoda, Jean M. Bennett
Publikováno v:
SPIE Proceedings.
The measurement of total scatter losses is a major prerequisite for the development, optimization and commercialization of high quality optical components. Especially in laser technology, optical scattering gained of importance in the source of the d
Publikováno v:
Specification, Production, and Testing of Optical Components and Systems.
We investigated thin MgF2/LaF3- and LaF3/MgF2-layers on opaque glass with angle resolved light scattering to analyze the different scattering contributions. We already showed the possibility of separating the volume scattering from the interface cont
Publikováno v:
Optical Interference Coatings.
A theoretical formalism and experimental methods are presented, which enable statistical fluctuations of the films bulk and interface roughness properties to be estimated from volume scattering and roughness scattering, respectively. The theoretical
Publikováno v:
Optical Thin Films IV: New Developments.
An attempt is presented of a systematic experimental approach to the problem of scattering and roughness modification after deposition of an optical thin film. BK 7 substrates with different surface qualities have been coated with evaporated MgF2, La
Publikováno v:
SPIE Proceedings.
The microtopography of a certain surface is a complicated structure varying across the complete surface. Every surface has different elements of microstructure. In this paper, we consider roughness as a fine structure and defects as large structure e
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