Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Urena-Acuna A."'
Autor:
Urena-Acuna A., Favrichon J., Cantrel E., Robin P.A., Balier A., Maraine T., Saigné F., Boch J.
Publikováno v:
EPJ Web of Conferences, Vol 288, p 07014 (2023)
In this work, we show the first steps of a systemlevel qualification methodology for a series of Commercial off-the Shelf (COTS) environment sensors subjected to Total Ionizing Dose (TID). We demonstrate a correlation between the degradation of elect
Externí odkaz:
https://doaj.org/article/f925cd53752f4d6e918b68ac6498bc73
Autor:
Urena Acuna, Alejandro
Publikováno v:
Other. Université Paris-Saclay, 2021. English. ⟨NNT : 2021UPAST082⟩
Ionizing radiation causes malfunction in electronic systems, from miscalculations to a total device failure. At nanometric scale, high-energy radiation produces charges liable to be trapped in the insulating oxides of the device. These trapped charge
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::a51699fe345a643ae76c5e0ecc6b704d
https://tel.archives-ouvertes.fr/tel-03339535/file/98798_URENA_ACUNA_2021_archivage.pdf
https://tel.archives-ouvertes.fr/tel-03339535/file/98798_URENA_ACUNA_2021_archivage.pdf
Publikováno v:
Microelectronics Reliability
Microelectronics Reliability, 2021, 126, pp.114397. ⟨10.1016/j.microrel.2021.114397⟩
ESREF 2021 : 32th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2021
ESREF 2021 : 32th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2021, IMS laboratory, University of Bordeaux; LAAS-CNRS, University of Toulouse – Bordeaux, Oct 2021, Bordeaux, France. pp.114397
Microelectronics Reliability, 2021, 126, pp.114397. ⟨10.1016/j.microrel.2021.114397⟩
ESREF 2021 : 32th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2021
ESREF 2021 : 32th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2021, IMS laboratory, University of Bordeaux; LAAS-CNRS, University of Toulouse – Bordeaux, Oct 2021, Bordeaux, France. pp.114397
International audience; This work presents the performance degradation of a 32-bit DSP fabricated with 28 nm FDSOI technology subjected to different levels of gamma radiation. A new mixed hardening methodology based on electrical compensation and the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::807c0c0b14cab3822fb6001579f069fe
https://hal.science/hal-03480961
https://hal.science/hal-03480961
Publikováno v:
Radecs 2018-18th European Conference on Radiation and Its Effects on Components and Systems
Radecs 2018-18th European Conference on Radiation and Its Effects on Components and Systems, Sep 2018, Göteborg, Sweden. ⟨10.1109/RADECS45761.2018.9328696⟩
Radecs 2018-18th European Conference on Radiation and Its Effects on Components and Systems, Sep 2018, Göteborg, Sweden. ⟨10.1109/RADECS45761.2018.9328696⟩
International audience; A Radiation hardened temperature controller intended to regenerate CMOS circuits has been designed using commercial off-the-shelf components. Tested with $^{60}$Co gamma rays, it has shown a radiation hardness greater than 65
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2cb623082ecb18a9b453c0c646d4b06a
https://cea.hal.science/cea-03922951/document
https://cea.hal.science/cea-03922951/document