Zobrazeno 1 - 10
of 306
pro vyhledávání: '"Urbach HP"'
Autor:
Shao Y; Imaging Physics Department, Applied Science Faculty, Delft University of Technology, Lorentzweg 1, Delft, 2628 CJ, The Netherlands. Y.Shao@tudelft.nl.; Nanophotonics, Debye Institute for Nanomaterials Science and Center for Extreme Matter and Emergent Phenomena, Utrecht University, P.O. Box 80000, Utrecht, 3508 TA, The Netherlands. Y.Shao@tudelft.nl., Weerdenburg S; Imaging Physics Department, Applied Science Faculty, Delft University of Technology, Lorentzweg 1, Delft, 2628 CJ, The Netherlands., Seifert J; Nanophotonics, Debye Institute for Nanomaterials Science and Center for Extreme Matter and Emergent Phenomena, Utrecht University, P.O. Box 80000, Utrecht, 3508 TA, The Netherlands., Urbach HP; Imaging Physics Department, Applied Science Faculty, Delft University of Technology, Lorentzweg 1, Delft, 2628 CJ, The Netherlands., Mosk AP; Nanophotonics, Debye Institute for Nanomaterials Science and Center for Extreme Matter and Emergent Phenomena, Utrecht University, P.O. Box 80000, Utrecht, 3508 TA, The Netherlands., Coene W; Imaging Physics Department, Applied Science Faculty, Delft University of Technology, Lorentzweg 1, Delft, 2628 CJ, The Netherlands.; Research Department, ASML Netherlands B.V, De Run 6501, Veldhoven, 5504 DR, The Netherlands.
Publikováno v:
Light, science & applications [Light Sci Appl] 2024 Aug 19; Vol. 13 (1), pp. 196. Date of Electronic Publication: 2024 Aug 19.
Publikováno v:
Applied optics [Appl Opt] 2024 Jun 01; Vol. 63 (16), pp. 4427-4434.
Publikováno v:
Optics express [Opt Express] 2023 Nov 06; Vol. 31 (23), pp. 38815-38830.
Autor:
Ji W; Department of Imaging Physics, Delft University of Technology, Lorentzweg 1, 2628 CJ, Delft, The Netherlands., Chang J; Department of Quantum Nanoscience, Delft University of Technology, Lorentzweg 1, 2628 CJ, Delft, The Netherlands. J.Chang-1@tudelft.nl., Xu HX; Shaanxi Key Laboratory of Flexible Electronics (KLoFE), Northwestern Polytechnical University (NPU), 127 West Youyi Road, Xi'an, 710072, China. hxxuellen@gmail.com., Gao JR; Department of Imaging Physics, Delft University of Technology, Lorentzweg 1, 2628 CJ, Delft, The Netherlands.; SRON Netherlands Institute for Space Research, Niels Bohrweg 4, 2333 CA, Leiden, The Netherlands., Gröblacher S; Department of Quantum Nanoscience, Delft University of Technology, Lorentzweg 1, 2628 CJ, Delft, The Netherlands., Urbach HP; Department of Imaging Physics, Delft University of Technology, Lorentzweg 1, 2628 CJ, Delft, The Netherlands. H.P.Urbach@tudelft.nl., Adam AJL; Department of Imaging Physics, Delft University of Technology, Lorentzweg 1, 2628 CJ, Delft, The Netherlands.
Publikováno v:
Light, science & applications [Light Sci Appl] 2023 Jul 07; Vol. 12 (1), pp. 169. Date of Electronic Publication: 2023 Jul 07.
Publikováno v:
Journal of the Optical Society of America. A, Optics, image science, and vision [J Opt Soc Am A Opt Image Sci Vis] 2023 Jul 01; Vol. 40 (7), pp. 1289-1302.
Autor:
Wei X; Optics Research Group, Delft University of Technology, Lorentzweg 1, Delft, 2628 CJ, The Netherlands. Electronic address: x.wei-2@tudelft.nl., Urbach HP; Optics Research Group, Delft University of Technology, Lorentzweg 1, Delft, 2628 CJ, The Netherlands., van der Walle P; TNO Optics Department, Stieltjesweg 1, Delft, 2628 CK, The Netherlands., Coene WMJ; Optics Research Group, Delft University of Technology, Lorentzweg 1, Delft, 2628 CJ, The Netherlands; ASML Netherlands B.V, De Run 6501, Veldhoven, 5504 DR, The Netherlands.
Publikováno v:
Ultramicroscopy [Ultramicroscopy] 2021 Oct; Vol. 229, pp. 113335. Date of Electronic Publication: 2021 Jun 24.
Publikováno v:
Optics express [Opt Express] 2021 Aug 02; Vol. 29 (16), pp. 25632-25662.
Autor:
Zhang Y; Nanophotonics Research Center, Shenzhen Key Laboratory of Micro-Scale Optical Information Technology & Institute of Microscale Optoelectronics, Shenzhen University, Shenzhen, 518060, China., Min C; Nanophotonics Research Center, Shenzhen Key Laboratory of Micro-Scale Optical Information Technology & Institute of Microscale Optoelectronics, Shenzhen University, Shenzhen, 518060, China. cjmin@szu.edu.cn., Dou X; Nanophotonics Research Center, Shenzhen Key Laboratory of Micro-Scale Optical Information Technology & Institute of Microscale Optoelectronics, Shenzhen University, Shenzhen, 518060, China.; Optics Research Group, Delft University of Technology, Lorentzweg 1, 2628CJ, Delft, The Netherlands., Wang X; Nanophotonics Research Center, Shenzhen Key Laboratory of Micro-Scale Optical Information Technology & Institute of Microscale Optoelectronics, Shenzhen University, Shenzhen, 518060, China., Urbach HP; Optics Research Group, Delft University of Technology, Lorentzweg 1, 2628CJ, Delft, The Netherlands., Somekh MG; Nanophotonics Research Center, Shenzhen Key Laboratory of Micro-Scale Optical Information Technology & Institute of Microscale Optoelectronics, Shenzhen University, Shenzhen, 518060, China., Yuan X; Nanophotonics Research Center, Shenzhen Key Laboratory of Micro-Scale Optical Information Technology & Institute of Microscale Optoelectronics, Shenzhen University, Shenzhen, 518060, China. xcyuan@szu.edu.cn.
Publikováno v:
Light, science & applications [Light Sci Appl] 2021 Mar 17; Vol. 10 (1), pp. 59. Date of Electronic Publication: 2021 Mar 17.
Autor:
Cirillo, C.1 carla.cirillo@spin.cnr.it, Ejrnaes, M.2, Ercolano, P.3, Bruscino, C.3, Cassinese, A.3,4, Salvoni, D.5, Attanasio, C.6, Pepe, G. P.3, Parlato, L.3
Publikováno v:
Scientific Reports. 9/2/2024, Vol. 14 Issue 1, p1-9. 9p.
Autor:
Shao Y; Optics Research Group, Imaging Physics Department, Faculty of Applied Sciences, Delft University of Technology, Lorentzweg 1, 2628 CJ, Delft, The Netherlands. y.shao@tudelft.nl., Urbach HP; Optics Research Group, Imaging Physics Department, Faculty of Applied Sciences, Delft University of Technology, Lorentzweg 1, 2628 CJ, Delft, The Netherlands.
Publikováno v:
Light, science & applications [Light Sci Appl] 2021 Jan 11; Vol. 10 (1), pp. 12. Date of Electronic Publication: 2021 Jan 11.