Estimation of trap levels in SrTiO[sub 3] epitaxial films from measurement of (LaSr)MnO[sub 3]/SrTiO[sub 3]/(LaSr)TiO[sub 3] p-i-n diode characteristics.

Autor: Sugiura, Masanori, Uragou, Kazuyuki, Tachiki, Minoru, Kobayashi, Takeshi

Publikováno v: Journal of Applied Physics; 7/1/2001, Vol. 90 Issue 1, p187, 5p, 1 Black and White Photograph, 1 Diagram, 1 Chart, 6 Graphs