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pro vyhledávání: '"Uppili Raghunathan"'
Autor:
Adrian Ildefonso, Joel M. Hales, Ani Khachatrian, Jeffrey W. Teng, George N. Tzintzarov, Delgermaa Nergui, Brett L. Ringel, Uppili Raghunathan, Vibhor Jain, John D. Cressler, Dale McMorrow
Publikováno v:
IEEE Transactions on Nuclear Science. :1-1
Publikováno v:
ECS Meeting Abstracts. :1197-1197
SiGe HBTs offer significant performance advantage over Si BJTs with improved base resistance and base transit time. However, each faster technology iteration usually comes at the cost of reduced breakdown parameters. As a result, devices are often re