Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Ulrike Kindereit"'
Publikováno v:
International Symposium for Testing and Failure Analysis.
Anticipating the end of life for IR-based failure analysis techniques, a method of global backside preparation to ultra-thin remaining silicon thickness (RST) has been developed. When the remaining silicon is reduced, some redistribution of stress is
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2e6049008005533034b758036dbb01c1
https://doi.org/10.31399/asm.cp.istfa2016p0166
https://doi.org/10.31399/asm.cp.istfa2016p0166
Autor:
Ulrike Kindereit
Publikováno v:
2014 IEEE International Reliability Physics Symposium.
This paper will give an overview of the history of Laser Voltage Probing, explain the physical background of the signal generation process, provide insight into various detection schemes and measurement methods that were and currently are used in the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::531fb5c39c42a91a8ac7588bd35e300f
https://doi.org/10.1109/irps.2014.6860635
https://doi.org/10.1109/irps.2014.6860635
Autor:
Seongwon Kim, Ted R. Lundquist, Herschel A. Ainspan, Young H. Kwark, Franco Stellari, Alan J. Weger, Christian W. Baks, Peilin Song, Dzmitry Maliuk, Vikas Anant, Ulrike Kindereit
Publikováno v:
International Symposium for Testing and Failure Analysis.
In this paper, we present a Superconducting Nanowire Single Photon Detector (SnSPD) system and its application to ultra low voltage Time-Resolved Emission (TRE) measurements (also known as Picosecond Imaging Circuit Analysis, PICA) of scaled VLSI cir
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1e48883943852b2928b5eb9499ae90b1
https://doi.org/10.31399/asm.cp.istfa2013p0182
https://doi.org/10.31399/asm.cp.istfa2013p0182
Autor:
Ulrike Kindereit, Peilin Song, Herve Deslandes, Prasad Sabbineni, Alan J. Weger, Ted R. Lundquist, Franco Stellari
Publikováno v:
International Symposium for Testing and Failure Analysis.
In this paper, near-infrared photon emission spectroscopy measurements from ring oscillators in 45 nm and 32 nm SOI process technology are compared. Employing a cryogenically cooled camera, the measurements cover a broad spectral range from 1200-2200
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ce7f47c3453f5b3570ee05b2d0609a4b
https://doi.org/10.31399/asm.cp.istfa2012p0128
https://doi.org/10.31399/asm.cp.istfa2012p0128
Autor:
Herve Deslandes, Peilin Song, Alan J. Weger, Ted R. Lundquist, Ulrike Kindereit, Franco Stellari, Prasad Sabbineni
Publikováno v:
2012 IEEE International Reliability Physics Symposium (IRPS).
This paper presents, for the first time, near-infrared spectral photon emission measurements of a ring oscillator in IBM's 45 nm SOI process technology. The setup employs a cryogenically cooled MCT camera and different band-pass filters with a very b
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::77b4207c1a8d9d71821d8b05fae30aed
https://doi.org/10.1109/irps.2012.6241783
https://doi.org/10.1109/irps.2012.6241783