Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Ulfig RM"'
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Autor:
Thompson, K, Larson, DJ, Bunton, JH, Ulfig, RM, Prosa, TJ, Sebastian, JT, Lenz, DR, Gerstl, SS A, Reinhard, DA, Olson, JD, Kelly, TF
Publikováno v:
Microscopy & Microanalysis; Aug2006 Supplement, Vol. 12 Issue S02, p1738-1739, 2p
Autor:
Bertero E; Empa - Swiss Federal Laboratories for Materials Science and Technology, Laboratory for Mechanics of Materials and Nanostructures Feuerwerkerstrasse 39 3602 Thun Switzerland enrico.bertero@empa.ch cristina.vicente@empa.ch johann.michler@empa.ch laetitia.philippe@empa.ch +41 58 765 69 90 +41 58 765 63 93.; Ecole Polytechnique Fédérale de Lausanne, Tribology and Interfacial Chemistry Group, Materials Institute Station 12 (SCI-STI-SM) 1015 Lausanne Switzerland stefano.mischler@epfl.ch., Manzano CV; Empa - Swiss Federal Laboratories for Materials Science and Technology, Laboratory for Mechanics of Materials and Nanostructures Feuerwerkerstrasse 39 3602 Thun Switzerland enrico.bertero@empa.ch cristina.vicente@empa.ch johann.michler@empa.ch laetitia.philippe@empa.ch +41 58 765 69 90 +41 58 765 63 93., Pellicer E; Departament de Física, Facultat de Ciències, Universitat Autònoma de Barcelona 08193 Bellaterra Spain eva.pellicer@uab.cat jordi.sort@uab.cat., Sort J; Departament de Física, Facultat de Ciències, Universitat Autònoma de Barcelona 08193 Bellaterra Spain eva.pellicer@uab.cat jordi.sort@uab.cat.; Institució Catalana de Recerca i Estudis Avançats (ICREA) Pg. Lluís Companys 23 08010 Barcelona Spain., Ulfig RM; CAMECA Instruments Inc. 5470 Nobel Drive Madison WI 53711 USA robert.ulfig@ametek.com., Mischler S; Ecole Polytechnique Fédérale de Lausanne, Tribology and Interfacial Chemistry Group, Materials Institute Station 12 (SCI-STI-SM) 1015 Lausanne Switzerland stefano.mischler@epfl.ch., Michler J; Empa - Swiss Federal Laboratories for Materials Science and Technology, Laboratory for Mechanics of Materials and Nanostructures Feuerwerkerstrasse 39 3602 Thun Switzerland enrico.bertero@empa.ch cristina.vicente@empa.ch johann.michler@empa.ch laetitia.philippe@empa.ch +41 58 765 69 90 +41 58 765 63 93., Philippe L; Empa - Swiss Federal Laboratories for Materials Science and Technology, Laboratory for Mechanics of Materials and Nanostructures Feuerwerkerstrasse 39 3602 Thun Switzerland enrico.bertero@empa.ch cristina.vicente@empa.ch johann.michler@empa.ch laetitia.philippe@empa.ch +41 58 765 69 90 +41 58 765 63 93.
Publikováno v:
RSC advances [RSC Adv] 2019 Aug 16; Vol. 9 (44), pp. 25762-25775. Date of Electronic Publication: 2019 Aug 16 (Print Publication: 2019).
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2011 Jun; Vol. 17 (3), pp. 418-30.
Autor:
Bennett SE; Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ, UK. sb534@cam.ac.uk, Ulfig RM, Clifton PH, Kappers MJ, Barnard JS, Humphreys CJ, Oliver RA
Publikováno v:
Ultramicroscopy [Ultramicroscopy] 2011 Feb; Vol. 111 (3), pp. 207-11. Date of Electronic Publication: 2010 Dec 01.
Autor:
Russell KF; Material Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6136, USA., Miller MK, Ulfig RM, Gribb T
Publikováno v:
Ultramicroscopy [Ultramicroscopy] 2007 Sep; Vol. 107 (9), pp. 750-5. Date of Electronic Publication: 2007 Mar 03.
Autor:
Kelly TF; Imago Scientific Instruments Corporation, 6300 Enterprise Lane, Madison, WI 53719-1193, USA. tkelly@imago.com, Gribb TT, Olson JD, Martens RL, Shepard JD, Wiener SA, Kunicki TC, Ulfig RM, Lenz DR, Strennen EM, Oltman E, Bunton JH, Strait DR
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2004 Jun; Vol. 10 (3), pp. 373-83.