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pro vyhledávání: '"Uesugi Tomohiro"'
Publikováno v:
2019 Compound Semiconductor Week (CSW).
In situ synchrotron X-ray reciprocal space mapping was carried out to investigate the evolution of lattice strain and crystal structure of InGaN/GaN heterostructure nanowires grown by molecular beam epitaxy. At the beginning of the growth, the InGaN
Publikováno v:
2019 Compound Semiconductor Week (CSW).
The molecular beam epitaxial (MBE) growth of twenty-period InGaN/GaN multi-quantum-well (MQW) nanowires was investigated by in situ X-ray reciprocal space mapping (in situ RSM). The evolution of strain, composition, and their inhomogeneities during t