Zobrazeno 1 - 10
of 49
pro vyhledávání: '"Udo Kroth"'
Publikováno v:
IEEE Photonics Technology Letters. 33:1415-1418
Publisher Copyright: IEEE Silicon solar cells are known to suffer from poor emitter performance that is seen as reduced external quantum efficiency at wavelengths below 500 nm. This is due to common tradeoff between electrical and optical performance
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0fb156cd273c91b71c394f6076a174f4
https://doi.org/10.1109/lpt.2021.3124307
https://doi.org/10.1109/lpt.2021.3124307
Autor:
Oskar Ogor, Andrew D. Holland, Ian Moody, Andrew I. Harris, Matthew R. Soman, Chiaki Crews, Alexander Gottwald, Thomas W. Buggey, J. Heymes, Xiao Meng, Andrew Kelt, George Randall, Udo Kroth
Publikováno v:
X-Ray, Optical, and Infrared Detectors for Astronomy IX
Teledyne-e2v's sensors and wafer-scale processing are widely used for high performance imaging across soft X-ray and optical bands. In the ultraviolet spectral range, the combination of short absorption lengths (below 10 nm) and high reflectance (up
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fb6e6760c62d506284f56fb290b0a13b
https://doi.org/10.1117/12.2559711
https://doi.org/10.1117/12.2559711
Publikováno v:
Applied optics. 56(20)
The index of refraction and the extinction coefficient for thin films of boron carbide were determined by angle-dependent reflectance measurements in the vacuum-ultraviolet spectral range. The numerical approximation was done using transfer-matrix fo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::91d052539a85dc831ba0b7b250cc2952
https://pubmed.ncbi.nlm.nih.gov/29047720
https://pubmed.ncbi.nlm.nih.gov/29047720
Autor:
Alexander Gottwald, Frank Scholze, Vahid Mohammadi, Lin Qi, Wiebe de Boer, K. R. M. Mok, Udo Kroth, T.L.M. Scholtes, Negin Golshani, Lis K. Nanver, Amir Sammak
Publikováno v:
IEEE Journal of Selected Topics in Quantum Electronics. 20:306-316
This paper gives an assessment of old and new data relevant to the optical and electrical performance of PureB photodiodes for application in the wavelength range 2 nm to 400 nm. The PureB layer, fabricated by depositing pure boron on Si, forms the a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::07252f1920d8570c10297eb91cfe6502
https://doi.org/10.1109/jstqe.2014.2319582
https://doi.org/10.1109/jstqe.2014.2319582
Autor:
Ali BenMoussa, Guy Meynants, Frank Scholze, Bram Wolfs, Udo Schühle, Guy Berger, Christian Laubis, Jan Bogaerts, Udo Kroth, B. Giordanengo, Alexander Gottwald, Xinyang Wang, S. Gissot
Publikováno v:
IEEE Transactions on Electron Devices. 60:1701-1708
For the Extreme Ultraviolet Imager (EUI) of the Solar Orbiter mission, to be launched in 2017, CMOS active pixel sensor (APS) prototypes have been developed with several test pixel designs. A set of measurements was carried out to evaluate their perf
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4226db8674c47a15599ac82bf97df203
https://doi.org/10.1109/ted.2013.2255103
https://doi.org/10.1109/ted.2013.2255103
Publikováno v:
SPIE Proceedings.
Space-based missions exploring the spectral ranges of extreme- and vacuum-ultraviolet radiation (EUV, VUV) require on-ground, at-wavelength calibration of their detectors and imaging systems. With the use of monochromatized synchrotron radiation, tra
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::061e07895b786fa85d0ec41d07655a8d
https://doi.org/10.1117/12.2231405
https://doi.org/10.1117/12.2231405
Autor:
R. Fliegauf, Alexander Gottwald, Gerhard Ulm, H. Kaser, Arne Hoehl, G. Brandt, Udo Kroth, Roman Klein, Reiner Thornagel, Mathias Richter
Publikováno v:
Metrologia. 48:219-225
The spectral radiant intensity of synchrotron radiation from electron storage rings can be calculated from basic electrodynamic relations (Schwinger equation). A storage ring can, thus, be used as a radiometric primary source standard. The Metrology
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::29e0253467df8021cc3b2b2e51012bb8
https://doi.org/10.1088/0026-1394/48/3/017
https://doi.org/10.1088/0026-1394/48/3/017
Publikováno v:
Applied Optics. 57:8431
This work examines the electrical and radiometric characteristics of a photodiode based on a 4H-SiC semiconductor material with a semitransparent Cr Schottky barrier of about 7 nm thickness. The device had a photosensitive area 10 mm in diameter. The
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ccc23a5a1dd7a55d3ecfe0d7d28b6254
https://doi.org/10.1364/ao.57.008431
https://doi.org/10.1364/ao.57.008431
Autor:
Hendrik Schöppe, Takahiro Tanaka, Tetsuya Ishikawa, Kai Tiedtke, Andrey A. Sorokin, Yuichiro Morishita, Haruhiko Ohashi, Pavle Juranić, Mathias Richter, Mitsuru Nagasono, U. Jastrow, Udo Kroth, Makina Yabashi, Masahiro Kato, Tadashi Togashi, Kensuke Tono, Norio Saito, Hiroaki Kimura
Publikováno v:
Metrologia. 47:518-521
The absolute single-shot pulse energy of the SPring 8 extreme ultraviolet (EUV) free electron laser (FEL) was measured using a cryogenic radiometer with a relative standard uncertainty of 3%. The temperature change of the cavity in the cryogenic radi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1d8f065e46801764893b582243c19019
https://doi.org/10.1088/0026-1394/47/5/002
https://doi.org/10.1088/0026-1394/47/5/002
Autor:
Alexander Gottwald, Françoise Bridou, Mathias Richter, Mireille Cuniot-Ponsard, Jean-Michel Desvignes, Udo Kroth
Publikováno v:
Optics Communications
Optics Communications, Elsevier, 2010, 283, pp.1351-1358. ⟨10.1016/j.optcom.2009.11.062⟩
Optics Communications, Elsevier, 2010, 283, pp.1351-1358. ⟨10.1016/j.optcom.2009.11.062⟩
International audience; The investigation of some solar radiations of interest for astrophysicists requires optics in the 80–130 nm vacuum ultra-violet spectral range (VUV). In this domain, where both transmittance and reflectance of most materials
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::213030a3b37ad64d73e4151bee6562f8
https://doi.org/10.1016/j.optcom.2009.11.062
https://doi.org/10.1016/j.optcom.2009.11.062