Zobrazeno 1 - 10
of 14
pro vyhledávání: '"Udaibir Singh"'
Publikováno v:
International Journal of Sustainable Energy, Vol 41, Iss 10, Pp 1399-1407 (2022)
In this paper, the impact of pyramidal texture on a silicon substrate in ZnO/p-Si heterojunction was investigated. The texturisation of p-type silicon (100) substrate was obtained using the KOH anisotropic wet chemical etching method for different et
Externí odkaz:
https://doaj.org/article/524c042624464482b398e3eed9ed0549
Publikováno v:
Materials Technology. 37:2598-2607
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b31f62f72a1a806901dd0dd6f8f38f63
https://doi.org/10.1080/10667857.2022.2051938
https://doi.org/10.1080/10667857.2022.2051938
Publikováno v:
Materials Technology. 37:1320-1328
The thickness of dielectric spacer layer (DSL) plays an important role in performance of plasmonic solar cells. In this work, effect of thickness variation of ITO (indium tin oxide) DSL in silver (...
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3c734d63bbc0c9eccaf07e0717a24645
https://doi.org/10.1080/10667857.2021.1940046
https://doi.org/10.1080/10667857.2021.1940046
Autor:
Ajay Kumar, Abid Hussain, Abhilash J. Joseph, Sahil Goel, Rashi Gupta, Naorem Santakrus Singh, Udaibir Singh
Publikováno v:
Applied Physics A. 128
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a68269adfd8d6dfecf03f3261bbf7bb9
https://doi.org/10.1007/s00339-022-05800-w
https://doi.org/10.1007/s00339-022-05800-w
Publikováno v:
AIP Conference Proceedings.
In this paper, thin film of ZnO nanoparticles deposited on a planar Si (100) and a textured Si (100) substrate are investigated. Chemical etching is used to prepare textured Si substrate and RF magnetron sputtering is used to deposite ZnO thin films.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e687270485c44ae00184e75db0b7589d
https://doi.org/10.1063/5.0001997
https://doi.org/10.1063/5.0001997
Publikováno v:
AIP Conference Proceedings.
We have demonstrated the impact of fabrication of pyramidal structure on Silicon (Si) wafer substrate in ZnO/Si heterojunction on its structural and optical properties. The texture on Si substrate is obtained using wet etching method for different ti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::93648e5be3444f73bf313fdb943e4a7b
https://doi.org/10.1063/5.0001996
https://doi.org/10.1063/5.0001996
Publikováno v:
Journal of Applied Sciences. 11:2754-2763
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::36091a8f772acbfd92d3639524f6b152
https://doi.org/10.3923/jas.2011.2754.2763
https://doi.org/10.3923/jas.2011.2754.2763
Publikováno v:
Optics & Laser Technology. 42:1128-1133
In this paper the structure, morphology and optical properties of Pd thin films deposited on glass substrate by pulse laser deposition technique at two different substrate temperatures have been investigated. The fabricated films were characterized b
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cde0752d974affdc96f2c1a22bbe9971
https://doi.org/10.1016/j.optlastec.2010.02.007
https://doi.org/10.1016/j.optlastec.2010.02.007
Autor:
Udaibir Singh, Avinashi Kapoor
Publikováno v:
Optics & Laser Technology. 40:315-324
In this paper a homogeneous single layer model for surface roughness by polarized light has been developed. It has been shown that the reflectance change in non-absorbing layer is directly proportional to the refractive index of the ambient and subst
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::035ae861c670a4a4c007934b0b5c1f52
https://doi.org/10.1016/j.optlastec.2007.06.001
https://doi.org/10.1016/j.optlastec.2007.06.001
Publikováno v:
Optics & Laser Technology. 39:247-255
In this paper a homogeneous model for surface roughness in the identical double layer system has been presented. It has been shown that the reflectance change in non-absorbing layers is directly proportional to the square of the total thickness of th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::31735af9fa14f97da348becefa08904c
https://doi.org/10.1016/j.optlastec.2005.08.009
https://doi.org/10.1016/j.optlastec.2005.08.009