Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Ubbink RF"'
Autor:
Stam M; Optoelectronic Materials Section, Faculty of Applied Sciences, Delft University of Technology, Van der Maasweg 9, 2629 HZ Delft, The Netherlands., Almeida G; Optoelectronic Materials Section, Faculty of Applied Sciences, Delft University of Technology, Van der Maasweg 9, 2629 HZ Delft, The Netherlands., Ubbink RF; Optoelectronic Materials Section, Faculty of Applied Sciences, Delft University of Technology, Van der Maasweg 9, 2629 HZ Delft, The Netherlands., van der Poll LM; Optoelectronic Materials Section, Faculty of Applied Sciences, Delft University of Technology, Van der Maasweg 9, 2629 HZ Delft, The Netherlands., Vogel YB; Optoelectronic Materials Section, Faculty of Applied Sciences, Delft University of Technology, Van der Maasweg 9, 2629 HZ Delft, The Netherlands., Chen H; Optoelectronic Materials Section, Faculty of Applied Sciences, Delft University of Technology, Van der Maasweg 9, 2629 HZ Delft, The Netherlands., Giordano L; Physics and Chemistry of Nanostructures, Department of Chemistry, Ghent University, 9000 Gent, Belgium., Schiettecatte P; Physics and Chemistry of Nanostructures, Department of Chemistry, Ghent University, 9000 Gent, Belgium., Hens Z; Physics and Chemistry of Nanostructures, Department of Chemistry, Ghent University, 9000 Gent, Belgium., Houtepen AJ; Optoelectronic Materials Section, Faculty of Applied Sciences, Delft University of Technology, Van der Maasweg 9, 2629 HZ Delft, The Netherlands.
Publikováno v:
ACS nano [ACS Nano] 2024 Jun 04; Vol. 18 (22), pp. 14685-14695. Date of Electronic Publication: 2024 May 22.
Autor:
Vogel YB; Department of Chemical Engineering, Delft University of Technology, Van der Maasweg 9, 2629 HZ Delft, The Netherlands., Pham LN; Institute for Nanoscale Science and Technology, College of Science and Engineering, Flinders University, Bedford Park, South Australia 5042, Australia., Stam M; Department of Chemical Engineering, Delft University of Technology, Van der Maasweg 9, 2629 HZ Delft, The Netherlands., Ubbink RF; Department of Chemical Engineering, Delft University of Technology, Van der Maasweg 9, 2629 HZ Delft, The Netherlands., Coote ML; Institute for Nanoscale Science and Technology, College of Science and Engineering, Flinders University, Bedford Park, South Australia 5042, Australia., Houtepen AJ; Department of Chemical Engineering, Delft University of Technology, Van der Maasweg 9, 2629 HZ Delft, The Netherlands.
Publikováno v:
Journal of the American Chemical Society [J Am Chem Soc] 2024 Apr 10; Vol. 146 (14), pp. 9928-9938. Date of Electronic Publication: 2024 Mar 26.
Autor:
Ubbink RF; Optoelectronic Materials Section, Faculty of Applied Sciences, Delft University of Technology, Van der Maasweg 9, Delft 2629 HZ, The Netherlands., Gudjonsdottir S; Optoelectronic Materials Section, Faculty of Applied Sciences, Delft University of Technology, Van der Maasweg 9, Delft 2629 HZ, The Netherlands., Vogel YB; Optoelectronic Materials Section, Faculty of Applied Sciences, Delft University of Technology, Van der Maasweg 9, Delft 2629 HZ, The Netherlands., Houtepen AJ; Optoelectronic Materials Section, Faculty of Applied Sciences, Delft University of Technology, Van der Maasweg 9, Delft 2629 HZ, The Netherlands.
Publikováno v:
The journal of physical chemistry. C, Nanomaterials and interfaces [J Phys Chem C Nanomater Interfaces] 2023 May 15; Vol. 127 (20), pp. 9896-9902. Date of Electronic Publication: 2023 May 15 (Print Publication: 2023).
Autor:
Ubbink RF; Optoelectronic Materials Section, Faculty of Applied Sciences, Delft University of Technology, Van der Maasweg 9, 2629 HZ Delft, The Netherlands., Almeida G; Optoelectronic Materials Section, Faculty of Applied Sciences, Delft University of Technology, Van der Maasweg 9, 2629 HZ Delft, The Netherlands., Iziyi H; Optoelectronic Materials Section, Faculty of Applied Sciences, Delft University of Technology, Van der Maasweg 9, 2629 HZ Delft, The Netherlands., du Fossé I; Optoelectronic Materials Section, Faculty of Applied Sciences, Delft University of Technology, Van der Maasweg 9, 2629 HZ Delft, The Netherlands., Verkleij R; Optoelectronic Materials Section, Faculty of Applied Sciences, Delft University of Technology, Van der Maasweg 9, 2629 HZ Delft, The Netherlands., Ganapathy S; Department of Radiation Science and Technology, Faculty of Applied Sciences, Delft University of Technology, 2629 JB Delft, The Netherlands., van Eck ERH; Magnetic Resonance Research Center, Institute for Molecules and Materials, Radboud University, 6525 AJ Nijmegen, The Netherlands., Houtepen AJ; Optoelectronic Materials Section, Faculty of Applied Sciences, Delft University of Technology, Van der Maasweg 9, 2629 HZ Delft, The Netherlands.
Publikováno v:
Chemistry of materials : a publication of the American Chemical Society [Chem Mater] 2022 Nov 22; Vol. 34 (22), pp. 10093-10103. Date of Electronic Publication: 2022 Nov 04.