Zobrazeno 1 - 10
of 146
pro vyhledávání: '"Ubar, Raimund"'
The advanced complex electronic systems increasingly demand safer and more secure hardware parts. Correspondingly, fault injection became a major verification milestone for both safety- and security-critical applications. However, fault injection cam
Externí odkaz:
http://arxiv.org/abs/2103.05106
Recent safety standards set stringent requirements for the target fault coverage in embedded microprocessors, with the objective to guarantee robustness and functional safety of the critical electronic systems. This motivates the need for improving t
Externí odkaz:
http://arxiv.org/abs/1908.02986
Publikováno v:
2019 IEEE Latin American Test Symposium (LATS), Santiago, Chile, 2019, pp. 1-6
A new high-level implementation independent functional fault model for control faults in microprocessors is introduced. The fault model is based on the instruction set, and is specified as a set of data constraints to be satisfied by test data genera
Externí odkaz:
http://arxiv.org/abs/1907.12325
Publikováno v:
In Microprocessors and Microsystems September 2020 77
Publikováno v:
In Microelectronics Reliability February 2018 81:252-261
Publikováno v:
In Microprocessors and Microsystems February 2017 48:56-61
Publikováno v:
In Microprocessors and Microsystems November 2015 39(8):1130-1138
Publikováno v:
In Microprocessors and Microsystems November 2015 39(8):909-918
Autor:
Raik, Jaan, Repinski, Urmas, Chepurov, Anton, Hantson, Hanno, Ubar, Raimund, Jenihhin, Maksim
Publikováno v:
In Microprocessors and Microsystems June-July 2013 37(4-5):505-513
Publikováno v:
In Journal of Systems Architecture 2008 54(3):465-477