Zobrazeno 1 - 10
of 456
pro vyhledávání: '"UBAR R."'
Autor:
Gursoy, C. C., Jenihhin, M., Oyeniran, A. S., Piumatti, D., Raik, J., Reorda, M. Sonza, Ubar, R.
The identification of safe faults (i.e., faults which are guaranteed not to produce any failure) in an electronic system is a crucial step when analyzing its dependability and its test plan development. Unfortunately, safe fault identification is poo
Externí odkaz:
http://arxiv.org/abs/2009.11621
In the paper, an evolutionary approach to test generation for functional BIST is considered. The aim of the proposed scheme is to minimize the test data volume by allowing the device's microprogram to test its logic, providing an observation structur
Externí odkaz:
http://arxiv.org/abs/1008.0063
Publikováno v:
In Microelectronics Reliability 2002 42(7):1141-1149
Publikováno v:
In Microelectronics Reliability 2001 41(12):2023-2040
Autor:
Jutman, A., Ubar, R. *
Publikováno v:
In Microelectronics Reliability 2000 40(2):307-320
Publikováno v:
Радиоэлектроника и информатика.
This paper describes a diagnostic software package called Turbo Tester. It contains a variety of tools related to the area of testing and diagnosis of integrated circuits. The range of tools includes test generators, logic and fault simulators, a tes
Autor:
UBAR R.
Publikováno v:
Радиоэлектроника и информатика.
Publikováno v:
Scopus-Elsevier