Zobrazeno 1 - 10
of 34
pro vyhledávání: '"U. Schläfer"'
Publikováno v:
Journal of Materials Science Letters. 13:119-122
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3ab23c3f7e1912cfa9bf025b9a18d251
https://doi.org/10.1007/bf00416820
https://doi.org/10.1007/bf00416820
Publikováno v:
Modern Physics Letters B. :717-737
The properties of YBa 2 Cu 3 O 6+x thick films, deposited by plasma spraying of reacted powders in Ar atmosphere, are determined as a function of powder properties, conditions of post-annealing process and substrate materials. The relations between t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5532ea11391024cd9d3ccdb7e724e5c8
https://doi.org/10.1142/s0217984990000908
https://doi.org/10.1142/s0217984990000908
Publikováno v:
Fresenius' Journal of Analytical Chemistry. 349:150-152
Annealed laminates of YBa2Cu3Oy films on AgPd, SnO2 and Pt substrates were investigated by metallography, EPMA, and XDA. Thin homogeneous layers of Ba2SnO4 and BaZrO3 (in case of a ZrO2 diffusion barrier onto one side of AgPd) between ceramic and SnO
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::715f474ce208c483149bba42e4cce54b
https://doi.org/10.1007/bf00323245
https://doi.org/10.1007/bf00323245
Autor:
U. Schläfer, S. Rohr, G. Eckart, I. Bächer, A. Teresiak, H. Vinzelberg, L. Schneider, R. Müller
Publikováno v:
Materials Science Forum. :239-240
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::16a8af31b2c7b46661538bb659309c38
https://doi.org/10.4028/www.scientific.net/msf.62-64.239
https://doi.org/10.4028/www.scientific.net/msf.62-64.239
Publikováno v:
Materials Science Forum. :331-332
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::358d4706ebbc102771ec42d8a2beb856
https://doi.org/10.4028/www.scientific.net/msf.62-64.331
https://doi.org/10.4028/www.scientific.net/msf.62-64.331
Publikováno v:
Microelectronics International. 6:37-41
An attempt is made to discuss the adhesion of thick film conductors on ceramic substrates in connection with thermally induced internal stresses caused by mismatch of the thermal expansion coefficient of the various layers and the substrate. The curv
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3f5d31ef1097086d872580e267375ddc
https://doi.org/10.1108/eb044357
https://doi.org/10.1108/eb044357
Publikováno v:
Kristall und Technik. 11:409-429
Es werden die wichtigsten Anwendungsvorteile der Texturuntersuchung mittels Neutronenbeugung gegenuber der Rontgeninterferenzmethode dargestellt. Eine Beschreibung der am Rossendorfer Reaktor im Einsatz befindlichen Experimentiertechnik und der verwe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::009ea4c33af05e3a5354d8866aa3d754
https://doi.org/10.1002/crat.19760110412
https://doi.org/10.1002/crat.19760110412
Publikováno v:
Neuroscience Letters. 9:239-243
Using [ 3 H]diazepam, benzodiazepine receptor binding has been investigated in rat spinal cord synaptosomal membranes. Specific [ 3 H]diazepam binding is saturable with a K D of about 8 nM and a maximal number of binding sites of 0.48 pmol/mg protein
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fbfeb0be415d644516c1374492224e69
https://doi.org/10.1016/0304-3940(78)90079-4
https://doi.org/10.1016/0304-3940(78)90079-4
Microanalytical characterization of microscopic defects in NiCr-based alloys of low impurity content
Publikováno v:
Journal of Materials Science. 22:325-330
The quality of thin foil components made from NiCr-based alloys can be reduced by three-dimensional defects formed during alloy preparation and roMng cycles of foil manufacturing. In particular, the appearance of microscopic holes, i.e. defects trans
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f37fc00282f9a4068b0a4744be9294ef
https://doi.org/10.1007/bf01160588
https://doi.org/10.1007/bf01160588
Publikováno v:
Kristall und Technik. 15:K94-K97
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3c5216c662e5790c43f994e013afbed1
https://doi.org/10.1002/crat.19800150920
https://doi.org/10.1002/crat.19800150920