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Publikováno v:
International Journal of Engineering and Advanced Technology. 9:296-299
As the CMOS innovation is downsizing, spillage power has gotten one of the most basic structure worries for the chip fashioner. This paper proposes examination on the adequacy of current gracefully testing strategies in cmos operational amplifiers. I
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::37e89499a93f594e4bfe97d533e3ee72
https://doi.org/10.35940/ijeat.e9313.069520
https://doi.org/10.35940/ijeat.e9313.069520
