Zobrazeno 1 - 10
of 72
pro vyhledávání: '"U. Haak"'
Autor:
Joachim Bauer, Jürgen Drews, K. Schulz, Jens Katzer, W. Hoppner, U. Haak, P. Kulse, K. E. Ehwald, Mario Birkholz, D. Wolansky
Publikováno v:
Microelectronic Engineering. 97:276-279
A fabrication process of ultrathin TiN micro-electromechanical systems (MEMS) actuators intended for applications in electrostatic actuator schemes is presented. It includes the preparation of the TiN layer from the back end of line (BEOL) module of
Autor:
R. Scholz, M. Marschmeyer, D. Knoll, Thomas Grabolla, Johannes Borngraber, R. Barth, H.-E. Wulf, Bernd Heinemann, Peter Schley, Rainer Kurps, B. Kuck, K.E. Ehwald, D. Wolansky, Holger Rucker, W. Hoppner, U. Haak, D. Bolze, Bernd Tillack, H.H. Richter, J. Drews, D. Krüger, J. Bauer, Peter Zaumseil, Wolfgang Winkler, D. Schmidt, Yuji Yamamoto
Publikováno v:
Applied Surface Science. 224:297-305
Carbon-doped SiGe (SiGe:C) bipolar devices have been developed and integrated in to a 0.25 μm CMOS platform. The resulting SiGe:C BiCMOS technology offers a wide spectrum of active and passive devices for wireless and wired communication systems. A
Publikováno v:
Chemoecology. 7:85-93
By means of gas chromatography, gas chromatographic coupled mass spectrometry, trail-following experiments and electrophysiological recordings from worker antennae, the major trail pheromone components from the hindgut of the formicine speciesCampono
Publikováno v:
Monthly Weather Review. 123:578-581
Murakami's recursive filter technique is suitable for computing storm tracks with reduced needs in data length, and it decreases computing time by the factor 3.5. It is shown that the storm tracks differ only slightly from the ones obtained using the
Autor:
K. Schulz, W. Hoppner, A. Scheit, Joachim Bauer, D. Wolansky, Jens Katzer, H. Rucker, U. Haak, Andreas Mai, P. Kulse
Publikováno v:
2012 International Semiconductor Conference Dresden-Grenoble (ISCDG).
A methodology for fast detection of via faults is presented. Defective vias in large via chains are detected by subsequent use of a parametric tester for resistance measurements, a CD-SEM for voltage contrast inspection and defect localization, and f
Autor:
S. Marschmeyer, Jürgen Bruns, Ivano Giuntoni, Joachim Bauer, Bernd Tillack, H. Richter, L. Zimmermann, U. Haak, Andrzej Gajda, Klaus Petermann, David Stolarek
Publikováno v:
SPIE Proceedings.
In this Paper we present a deep ultra-violet lithography (248nm) based double patterning technique for the fabrication of Bragg gratings on SOI rib waveguides. The principle of the used double patterning technique is presented, as well the influence
Autor:
Bernd Tillack, G. G. Fischer, D. Knoll, Peter Schley, J. Schmidt, Thomas Grabolla, A. Fox, D. Wolansky, K. Schulz, Wolfgang Winkler, J. Drews, Steffen Marschmeyer, Bernd Heinemann, Andreas Mai, J. Borngraber, D. Schmidt, Holger Rucker, U. Haak, Yuji Yamamoto, R. Barth, F. Korndorfer
Publikováno v:
2009 IEEE Bipolar/BiCMOS Circuits and Technology Meeting.
A 0.13 µm SiGe BiCMOS technology for millimeter wave applications is presented. This technology features high-speed HBTs (f T =240 GHz, f max =330 GHz, BV CEO =1.7 V) along with high-voltage HBTs (f T =50 GHz, f max =130 GHz, BV CEO =3.7 V) integrat
Autor:
B. Kuck, D. Wolansky, R. Barth, Peter Schley, D. Knoll, A. Fox, Bernd Heinemann, G. Weidner, Ch. Wipf, Steffen Marschmeyer, U. Haak, Bernd Tillack, Holger Rucker, D. Schmidt, R. Kurps, Harald H. Richter, D. Bolze, Yuji Yamamoto, J. Drews
Publikováno v:
2008 IEEE International Electron Devices Meeting.
We present a double-polysilicon SiGe:C HBT module showing a CML ring oscillator (RO) gate delay tau of 2.5 ps, and fT/ fmax/BVCEo values of 300 GHz/350 GHz/1.85V. A key new feature of the HBT module is a connection of the extrinsic and intrinsic base
Publikováno v:
SPIE Proceedings.
In this paper, we will present a new swing curve measurement and simulation method. Swing curve measurements were completed using a high NA KrF Scanner (Nikon S207D) where illumination and reflectance sensors were utilised to measure the reflectivity
Autor:
B. Heinemann, R. Barth, D. Bolze, J. Drews, P. Formanek, Th. Grabolla, U. Haak, W. Hoppner, D. Knoll, K. Kopke, B. Kuck, R. Kurps, S. Marschmeyer, H.H. Richter, H. Rucker, P. Schley, D. Schmidt, W. Winkler, D. Wolansky, H.-E. Wulf, Y. Yamamoto
Publikováno v:
Scopus-Elsevier
We present a new collector construction for high-speed SiGe:C HBTs that substantially reduces the parasitic base-collector capacitance by selectively underetching of the collector region. The impact of the collector module on RF performance is demons