Zobrazeno 1 - 1
of 1
pro vyhledávání: '"U. Frohler"'
Publikováno v:
2008 2nd Electronics Systemintegration Technology Conference.
The work presented applies a statistical approach to study randomly distributed solder voids in MOSFET products. The grid size was varied as independent of the mesh element to account for typical void sizes observed in X-ray images. Thereafter the im
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6e185f1052cc1bae5e4a1bec846e3ee1
https://doi.org/10.1109/estc.2008.4684356
https://doi.org/10.1109/estc.2008.4684356
