Zobrazeno 1 - 4
of 4
pro vyhledávání: '"U. A. Mikitsevich"'
Publikováno v:
Pribory i Metody Izmerenij, Vol 14, Iss 3, Pp 161-172 (2023)
Non-contact electrical methods are widely used for research and control of semiconductor wafers. The methods are usually based on surface potential measurement (CPD) in combination with illumination and/or deposition of charges on the sample using a
Externí odkaz:
https://doaj.org/article/18c3f979e2594477a14af243f7061f06
Publikováno v:
Pribory i Metody Izmerenij, Vol 14, Iss 1, Pp 18-26 (2023)
Measuring devices and systems containing sensors that require sinusoidal excitation are widely used in information and measurement technology both in production conditions and in research practice. Examples include various types of metal detectors, e
Externí odkaz:
https://doaj.org/article/3eb1d2c7144e4b3c99a243eedbd12bd6
Autor:
K. U. Pantsialeyeu, U. A. Mikitsevich, A. I. Svistun, R. I. Vorobey, O. K. Gusev, A. L. Zharin
Publikováno v:
Pribory i Metody Izmerenij, Vol 13, Iss 4, Pp 291-301 (2022)
Surface charge can be used as an information parameter about the change in the state of the material under the action of mechanical stresses. The aim of the work was to develop methods for studying deformation processes in metallic and polymeric mate
Externí odkaz:
https://doaj.org/article/cff9c4006ddb4a838d3b83798072ff71
Publikováno v:
Pribory i Metody Izmerenij, Vol 7, Iss 1, Pp 7-15 (2016)
The contact potential difference probes distinguished by great variety and produced mostly in the laboratory for specific experimental applications. As a rule, they consist of commercially available instrumentation, and have a number of disadvantages
Externí odkaz:
https://doaj.org/article/25848920789c48cc9b60340e9a7225e4