Zobrazeno 1 - 3
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pro vyhledávání: '"Tzu Kuei Wen"'
Autor:
Tzu Kuei Wen, Ching-Chung Yin
Publikováno v:
Solar Energy Materials and Solar Cells. 98:216-223
Cracking is a common problem encountered during the fabrication of crystalline silicon photovoltaic (PV) cells. In this study, electronic speckle pattern interferometry (ESPI) is developed as a tool for rapid identification of cracks in PV cells. The
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a4eaac360fd6b2dac22d4c4056fd73c9
https://doi.org/10.1016/j.solmat.2011.10.034
https://doi.org/10.1016/j.solmat.2011.10.034
Autor:
Tzu Kuei Wen, Ching-Chung Yin
Publikováno v:
SPIE Proceedings.
The yield of photovoltaic (PV) cells is often reduced by micro-defects in crystalline silicon substrates during fabrication. Common optical inspection for a thin crack in such a large silicon photovoltaic cell is extremely time-consuming and fails in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d5e00c575fa4e4ffe096ae8b99b20653
https://doi.org/10.1117/12.905261
https://doi.org/10.1117/12.905261
Autor:
Tzu Kuei Wen, Ching-Chung Yin
Publikováno v:
SPIE Proceedings.
This paper presents a full field nondestructive testing method to inspect the micro-defects embedded in photovoltaic (PV) cells by using electronic speckle pattern interferometry. The edge-clamped solar cells were heated to induce thermal deflection.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5c4f211fa2919cf35530e35a7da49d84
https://doi.org/10.1117/12.851695
https://doi.org/10.1117/12.851695