Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Tung-Li Shen"'
Publikováno v:
IEEE Journal of Solid-State Circuits. 28:72-77
Built-in current testing is known to enhance the defect coverage in CMOS VLSI. An experimental CMOS chip containing a high-speed built-in current sensing (BICS) circuit design is described. This chip has been fabricated through MOSIS 2- mu m p-well C
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5f4355c798f8be749c2fbdd6613103c3
https://doi.org/10.1109/4.179205
https://doi.org/10.1109/4.179205
Publikováno v:
VTS
CMOS is a popular technology today for very large scale integrated (VLSI) circuits. But, conventional functional testing cannot guarantee the detection of some defects. Built-in current testing has been suggested to enhance the defect coverage. In th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3ae9b70a8e727e5a03a9a2edaa0defe8
https://doi.org/10.1109/vtest.1992.232771
https://doi.org/10.1109/vtest.1992.232771
Publikováno v:
Digest of Papers 1992 IEEE VLSI Test Symposium; 1992, p309-314, 6p
Publikováno v:
IEEE Journal of Solid-State Circuits; 1993, Vol. 28 Issue 1, p72-77, 6p