Zobrazeno 1 - 10
of 29
pro vyhledávání: '"Tsuyoshi Shioda"'
Autor:
Peter Hacke, Sergiu Spataru, Nancy H. Phillips, Tadanori Tanahashi, David C. Miller, Tsuyoshi Shioda, Michael D. Kempe, Michael Owen-Bellini, Kaushik Roy Choudhury, Keiichiro Sakurai, William J. Gambogi
Publikováno v:
Web of Science
Tanahahi, T, Sakurai, K, Shioda, T, Gambogi, W, Phillips, N, Choudhury, K, Spataru, S V, Miller, D, Kempe, M, Owen-Bellini, M & Hacke, P 2019, Reproducing the “Framing” by a Sequential Stress Test . in Proceedings of 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC) ., 8980920, IEEE Press, I E E E Photovoltaic Specialists Conference. Conference Record, 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC), Chicago, United States, 16/06/2019 . https://doi.org/10.1109/PVSC40753.2019.8980920
Tanahahi, T, Sakurai, K, Shioda, T, Gambogi, W, Phillips, N, Choudhury, K, Spataru, S V, Miller, D, Kempe, M, Owen-Bellini, M & Hacke, P 2019, Reproducing the “Framing” by a Sequential Stress Test . in Proceedings of 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC) ., 8980920, IEEE Press, I E E E Photovoltaic Specialists Conference. Conference Record, 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC), Chicago, United States, 16/06/2019 . https://doi.org/10.1109/PVSC40753.2019.8980920
The “Framing” (local discoloration along cell edges) was induced by a simple sequential accelerated stress test (consisting of hygrothermal- and UV-stressors) applied to the PV modules with high OTR (oxygen transmission rate) backsheet, irrespect
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3e91c3d373b01c333d5cc756fa1b9311
https://doi.org/10.1109/pvsc40753.2019.8980920
https://doi.org/10.1109/pvsc40753.2019.8980920
Autor:
Jinhua Wu, Kai Wang, Hui Juan Yan, Tsuyoshi Shioda, Richard Pitwon, Long Xiu Zhu, Alexander Carl Worrall, Marika Immonen, Hideo Itoh
Publikováno v:
Optics Communications. 362:22-32
The commercial adoption of electro-optical printed circuit board (EOCB) technology will be accelerated by the development of industrial and conformity standards for high volume fabrication, connector assembly and waveguide measurement. In this paper,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1cca98f2960b4d55d308649eca85de9e
https://doi.org/10.1016/j.optcom.2015.09.070
https://doi.org/10.1016/j.optcom.2015.09.070
Autor:
P. Schneider, J. Wu, Tsuyoshi Shioda, Richard Pitwon, S. Dorresteiner, Lars Brusberg, Dionysios Manessis, Marika Immonen, H.J. Yan, K. Wang, Henning Schröder, H. Itoh
Although the prospects for commercial proliferation of optical circuit board (OPCB) technology at the turn of the century were crippled by the rapid slow-down in the telecoms sector following the stock market crash in 2001, embedded waveguide-based O
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::37b5b05f5e5de68073e00f816653a20f
https://doi.org/10.1016/b978-0-08-100512-5.00013-9
https://doi.org/10.1016/b978-0-08-100512-5.00013-9
Autor:
Tsuyoshi Shioda
Publikováno v:
NIPPON GOMU KYOKAISHI. 81:93-98
Recent trends for optical circuit using transparent polymer were described. There are two kinds of actual and potential markets for optical circuit. One is an optical component for optical telecommunication, the other is an optical circuit board for
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::539b199fe3e147b69c5961bb66145125
https://doi.org/10.2324/gomu.81.93
https://doi.org/10.2324/gomu.81.93
Autor:
Tsuyoshi Shioda
Publikováno v:
Journal of Japan Institute of Electronics Packaging. 11:121-126
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bf70063c41c78c72e3a9ae294b07e5a6
https://doi.org/10.5104/jiep.11.121
https://doi.org/10.5104/jiep.11.121
Autor:
Xinxin Chen, Michael D. Kempe, Tsuyoshi Shioda, Shigeo Suga, Nancy H. Phillips, David C. Miller, Amal Ballion, Sean Fowler, Jiangtao Feng, Shin Watanabe, Peter Hacke, John H. Wohlgemuth, Roger H. French, Laure-Emmanuelle Perret-Aebi, Christian C. Honeker, Fanny Sculati-Meillaud, Kurt P. Scott, Eleonora Annigoni, Lamont Elliott, Jayesh G. Bokria, Laura S. Bruckman, Michael Köhl, Hussam Khonkar, David M. Burns, Xiaohong Gu
Publikováno v:
2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC).
Reduced optical transmittance of encapsulants resulting from ultraviolet (UV) degradation has frequently been identified as a cause of decreased PV module performance through the life of service in the field. The present module safety and qualificati
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0630afc2179e5274976354e71f6a898b
https://doi.org/10.1109/pvsc.2015.7355607
https://doi.org/10.1109/pvsc.2015.7355607
Autor:
Tsuyoshi Shioda
Publikováno v:
Journal of Japan Institute of Electronics Packaging. 9:204-210
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::36db32c5e5e406a084faf465dda98be9
https://doi.org/10.5104/jiep.9.204
https://doi.org/10.5104/jiep.9.204
Autor:
Tsuyoshi Shioda
Publikováno v:
Journal of Japan Institute of Electronics Packaging. 9:86-90
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1ab5ff98f0be547ff3a0c5baab75be42
https://doi.org/10.5104/jiep.9.86
https://doi.org/10.5104/jiep.9.86
Autor:
Tsuyoshi Shioda
Publikováno v:
KOBUNSHI RONBUNSHU. 61:1-11
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8393eea7c27206f555329a7f6cbd6ce8
https://doi.org/10.1295/koron.61.1
https://doi.org/10.1295/koron.61.1
Autor:
Tsuyoshi Shioda, Kenji Suzuki
Publikováno v:
Journal of Japan Institute of Electronics Packaging. 7:607-612
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6f3ecc285d50fb3e737807d0e19b9375
https://doi.org/10.5104/jiep.7.607
https://doi.org/10.5104/jiep.7.607