Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Tsuyohsi Ohnishi"'
Autor:
Tsuyohsi Ohnishi, Takahito Hashimoto, Takeo Kamino, Mitsuru Konno, Yasushi Kuroda, Kyoichiro Asayama, Toshie Yaguchi, Kaoru Umemura
Publikováno v:
Microscopy Today. 12:26-29
In characterization or failure analysis of new materials and semiconductor devices, the requirements for three dimensional observation and analysis are rapidly increasing. We discuss techniques for specimen preparation, three-dimensional observation,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d4cd2d31b960630fdffd8454a820e66e
https://doi.org/10.1017/s1551929500065937
https://doi.org/10.1017/s1551929500065937
Autor:
Toshie YAGUCHI, Takeo KAMINO, Takahito HASHIMOTO, Hidemi KOIKE, Tsuyohsi OHNISHI, Kyoichiro ASAYAMA
Publikováno v:
Journal of The Surface Finishing Society of Japan. 54:16-20
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c50200cbc9476d726a3adec9ad8bd945
https://doi.org/10.4139/sfj.54.16
https://doi.org/10.4139/sfj.54.16