Zobrazeno 1 - 10
of 463
pro vyhledávání: '"Tsunoda, I"'
Autor:
Rafí, J.M., Quirion, D., Duch, M., Lopez Paz, I., Dauderys, V., Claus, T., Moffat, N., Molas, B., Tsunoda, I., Yoneoka, M., Takakura, K., Kramberger, G., Moll, M., Pellegrini, G.
Publikováno v:
In Solid State Electronics November 2023 209
Autor:
Yun, J.W., Cvek, U., Kilgore, P.C.S.R., Tsunoda, I., Omura, S., Sato, F., Zivadinov, R., Ramanathan, M., Minagar, A., Alexander, J.S.
Publikováno v:
In Life Sciences 15 July 2019 229:116-123
Autor:
Alexander, J.S., Chervenak, R., Weinstock-Guttman, B., Tsunoda, I., Ramanathan, M., Martinez, N., Omura, S., Sato, F., Chaitanya, G.V., Minagar, A., McGee, J., Jennings, M.H., Monceaux, C., Becker, F., Cvek, U., Trutschl, M., Zivadinov, R.
Publikováno v:
In Journal of the Neurological Sciences 15 August 2015 355(1-2):84-89
Autor:
Rafí, J.M., González, M.B., Takakura, K., Tsunoda, I., Yoneoka, M., Beldarrain, O., Zabala, M., Campabadal, F.
Publikováno v:
In Solid State Electronics November 2013 89:198-206
Autor:
Rafí, J.M., González, M.B., Takakura, K., Tsunoda, I., Yoneoka, M., Beldarrain, O., Zabala, M., Campabadal, F.
Publikováno v:
In Microelectronics Reliability September-November 2013 53(9-11):1333-1337
Autor:
García, H., Castán, H., Dueñas, S., Bailón, L., Campabadal, F., Rafí, J.M., Zabala, M., Beldarrain, O., Ohyama, H., Takakura, K., Tsunoda, I.
Publikováno v:
In Thin Solid Films 1 May 2013 534:482-487
Autor:
Rafí, J.M., Campabadal, F., Ohyama, H., Takakura, K., Tsunoda, I., Zabala, M., Beldarrain, O., González, M.B., García, H., Castán, H., Gómez, A., Dueñas, S.
Publikováno v:
In Solid State Electronics January 2013 79:65-74
Autor:
Nakashima, T., Idemoto, T., Tsunoda, I., Takakura, K., Yoneoka, M., Ohyama, H., Yoshino, K., Gonzalez, M.B., Simoen, E., Claeys, C.
Publikováno v:
In Thin Solid Films 1 February 2012 520(8):3337-3340
Publikováno v:
In Microelectronic Engineering 2011 88(4):484-487
Autor:
Ohyama, H., Sakamoto, K., Sukizaki, H., Takakura, K., Tsukamoto, M., Matsuo, K., Tsunoda, I., Kato, I., Nakashima, T., Simoen, E., De Jaeger, B., Claeys, C.
Publikováno v:
In Microelectronic Engineering 2011 88(4):480-483