Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Tsui-Hua Huang"'
Autor:
Tsui-hua Huang, 黃翠華
95
In this paper we adopt performance appraisal tools of DEA (Data Envelopment Analysis), Sharpe index, Treynor index, and the average ROR (rate of return) of month, etc, to select stock portfolios. Then, we establish portfolios with equal weigh
In this paper we adopt performance appraisal tools of DEA (Data Envelopment Analysis), Sharpe index, Treynor index, and the average ROR (rate of return) of month, etc, to select stock portfolios. Then, we establish portfolios with equal weigh
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/69460078368809459233
Publikováno v:
Kybernetes, 2016, Vol. 45, Issue 4, pp. 650-665.
Externí odkaz:
http://www.emeraldinsight.com/doi/10.1108/K-08-2015-0208
Publikováno v:
Applied Mathematics & Information Sciences. 7:459-465
In recent years, the automation and electronic system in the logistics industr y have become popular topics in management, which consist of five segments, including marketing, logistics, information technology, banking system, and service system in t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7b4e4bb6788642f95a83e9d8851e8a73
https://doi.org/10.12785/amis/072l12
https://doi.org/10.12785/amis/072l12
Autor:
Tsui-Hua - Huang, 黃翠華
105
To enhance management efficacy and maximize utilities, more effective forecasting methodologies are required in the context of continued economic and technological developments. Due to its computing power, versatility, learning capability an
To enhance management efficacy and maximize utilities, more effective forecasting methodologies are required in the context of continued economic and technological developments. Due to its computing power, versatility, learning capability an
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/89816185703866196974
Publikováno v:
2009 IEEE International Reliability Physics Symposium.
A beam bounce technique in a conductive atomic force microscope (C-AFM) system is usually used to enable the probe head to measure extremely small movements of the cantilever as it is moved across the surface of the sample. However, the laser beam us
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9cf33a09c45dbbcbc137c6da00aaa8b8
https://doi.org/10.1109/irps.2009.5173353
https://doi.org/10.1109/irps.2009.5173353
Publikováno v:
2008 IEEE International Reliability Physics Symposium.
Electron energy loss spectrum (EELS) is widely used for material science analysis (F. R. Chen at al., 1998)(D. B. Williams et al., 1996), such as analyzing material elemental analysis and chemistry compound (Y. Mitsui et al., 1998)(M. Shimada et al.,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c3e2d464e8e0c362fc04330c93b4f342
https://doi.org/10.1109/relphy.2008.4558950
https://doi.org/10.1109/relphy.2008.4558950
Publikováno v:
13th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
The importance of understanding asymmetrical behaviour in SRAM has increased as the technology node shrinks below 100 nm. Single bit failure can possibly be caused by the malfunction of any of the six transistors in a standard SRAM cell. In order to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::30d1b892a370392324998d7c351c559b
https://doi.org/10.1109/ipfa.2006.250998
https://doi.org/10.1109/ipfa.2006.250998
Publikováno v:
2008 IEEE International Reliability Physics Symposium; 2008, p589-592, 4p
Publikováno v:
2006 13th International Symposium on the Physical & Failure Analysis of Integrated Circuits; 2006, p63-66, 4p