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pro vyhledávání: '"Tsotne Putkaradze"'
Autor:
Thomas Hollstein, Raimund Ubar, Siavoosh Payandeh Azad, Behrad Niazmand, Karl Janson, Apneet Kaur, Adeboye Stephen Oyeniran, Tsotne Putkaradze, Jaan Raik, Nevin George, Gert Jervan
Publikováno v:
DDECS
2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
Due to the ongoing miniaturization of silicon technology beyond the sub-micron domain and the trend of integrating ever more components on a single chip, the Network-on-Chip (NoC) paradigm has emerged to address the scalability and performance shortc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e67e6d3f6fe2d88f25c6061300935502
https://doi.org/10.1109/ddecs.2017.7934565
https://doi.org/10.1109/ddecs.2017.7934565
