Zobrazeno 1 - 10
of 19
pro vyhledávání: '"Tso-Min Chou"'
Autor:
Haosen Tan, Weida Zhang, Yudong Chen, Yuhe Xia, Chris Newey, Tso-Min Chou, Nai-Hsiang Sun, Jerome K. Butler, Gary A. Evans
Publikováno v:
IEEE Photonics Journal, Vol 14, Iss 6, Pp 1-10 (2022)
A simple thin film effective index analysis for first-order gratings in Si photonic waveguides is shown to provide highly accurate results for reflected and transmitted power spectrums as long as the waveguide remains single mode and non-radiating. A
Externí odkaz:
https://doaj.org/article/f109c095828c461c89785ad76fac35a1
Autor:
Haosen Tan, Weida Zhang, Yudong Chen, Yuhe Xia, Chris Newey, Tso-Min Chou, Nai-Hsiang Sun, Jerome K. Butler, Gary A. Evans
Publikováno v:
IEEE Photonics Journal, Vol 15, Iss 5, Pp 1-2 (2023)
We report errors in Table III of (Tan et al. 2022) that requires changing the text discussions in four places. These errors, due to using an incorrect thickness for the middle layer of a three-layer waveguide in an analytic formula (Huang et al., 201
Externí odkaz:
https://doaj.org/article/7b9aa45be9164e17987e2d5bab001ec2
Publikováno v:
IEEE Transactions on Electron Devices. 56:2895-2901
In this paper, a simple and reliable method to estimate the channel temperature of GaN high-electron mobility transistors (HEMTs) is proposed. The technique is based on electrical measurements of performance-related figures of merit (I Dmax and R ON)
Autor:
Hua-Quen Tserng, Jun Ren, Edward Beam, Huili Grace Xing, Manyam Pilla, Andrew Ketterson, Paul Saunier, Bo Song, Tso-Min Chou, Patrick Fay, Shuoqi Chen, Xiang Gao
Publikováno v:
2014 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS).
Autor:
Deep C. Dumka, Tso-Min Chou
Publikováno v:
Fourteenth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm).
Thermal assessment of AlGaN/GaN heterostructure on diamond substrate is presented. To emphasize the advantages of diamond substrate for GaN, results of test devices on GaN-on-Diamond material are compared to those on GaN-on-SiC and GaN-on-Si material
Autor:
Tso-Min Chou, Jieh-Ping Sih, Gary A. Evans, Jerome K. Butler, A. Mantle, Jay B. Kirk, S.R. Selmic, David P. Bour
Publikováno v:
IEEE Journal of Selected Topics in Quantum Electronics. 7:340-349
A comprehensive design method for long wavelength strained quantum-well lasers is applied to design uncooled multiple-quantum-well AlGaInAs-InP 1.3-/spl mu/m lasers for communication systems. The method includes multiband effective mass theory and el
Autor:
Mirko Bernardoni, Firooz Faili, Deep C. Dumka, Daniel Francis, Martin Kuball, Tso-Min Chou, Jose L. Jimenez, David M. Fanning, Felix Ejeckam, James W Pomeroy
Publikováno v:
2013 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS).
Thermal conductivity of the substrate affects the performance of high power RF devices. It is a dominant limiting factor in current state-of- the-art GaN HEMTs on SiC substrate. Due to high thermal conductivity, diamond substrate is an attractive alt
Autor:
Jerome K. Butler, Gary A. Evans, Tso-Min Chou, Chia-Ming Hu, Jung-Sheng Chiang, Shih-Chiang Lin, Nai-Hsiang Sun, Ping-Hung Lin
Publikováno v:
2013 International Symposium on Next-Generation Electronics.
A novel double input DBR grating is presented in this paper. The length of the grating region and the phase difference of the inputs can determine the direction and the efficiency of the output power.th of the grating region and the phase difference
Publikováno v:
2010 IEEE International Reliability Physics Symposium.
The accuracy of different thermography techniques for the determination of AlGaN/GaN HEMT channel temperature was investigated. Micro-Raman thermography, a novel electrical testing method, and IR thermography were applied to measure the temperature i
Publikováno v:
2007 ROCS Workshop[Reliability of Compound Semiconductors Digest].
A quick and reliable method to estimate the channel temperature of GaN high electron mobility transistors is extremely important in order to understand the physical degradation mechanisms as well as to extract a meaningful life time of the device. In