Zobrazeno 1 - 10
of 29
pro vyhledávání: '"Tsai Wen-Li"'
Autor:
Li, Ming-Yen, Su, Mei-Yun, Chang, Te-Fu, Tsai, Bin-Siang, Tsai, Wen-Li, Wu, Hsiao-Che, Chuang, Poyo, Yang, Tsung-Hsun, Yen, Haw
Publikováno v:
In Microelectronic Engineering 2008 85(7):1502-1510
Autor:
Tsai Bin-Siang, Te-Fu Chang, Wu Hsiao-Che, Ming-Yen Li, Haw Yen, Mei-Yun Su, Tsung-Hsun Yang, Tsai Wen-Li, Poyo Chuang
Publikováno v:
Microelectronic Engineering. 85:1502-1510
TiN/Al-0.5Cu/Ti film stacks deposited on SiO"2 substrate were studied by X-ray diffraction and electron microscopy to clarify the effects of the chamber long stay and post-deposition annealing on the morphology evolution. Experimental results indicat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::351ac0b7149be45399cc07365c2097ff
https://doi.org/10.1016/j.mee.2008.02.003
https://doi.org/10.1016/j.mee.2008.02.003
Autor:
Lau, John H., Lee, Ching-Kuan, Zhan, Chau-Jie, Wu, Sheng-Tsai, Chao, Yu-Lin, Dai, Ming-Ji, Tain, Ra-Min, Chien, Heng-Chieh, Chien, Chun-Hsien, Cheng, Ren-Shin, Huang, Yu-Wei, Lee, Yuan-Chang, Hsiao, Zhi-Cheng, Tsai, Wen-Li, Chang, Pai-Cheng, Fu, Huan-Chun, Cheng, Yu-Mei, Liao, Li-Ling, Lo, Wei-Chung, Kao, Ming-Jer
Publikováno v:
2014 IEEE 64th Electronic Components & Technology Conference (ECTC); 2014, p290-296, 7p
Autor:
Hsiao, Zhi-Cheng, Ko, Cheng-Ta, Chang, Hsiang-Hung, Fu, Huan-Chun, Chao-Kai Hsu, Shu-Man Li, Tsai, Wen-Li, Wen-Wei Shen, Jen-Chun Wang, Yu-Min Lin, Wei-Chung Lo
Publikováno v:
2014 International Conference on Electronics Packaging (ICEP); 2014, p82-85, 4p
Autor:
Lee, Ching-Kuan, Chien, Chun-Hsien, Chiang, Chia-Wen, Shen, Wen-Wei, Fu, Huan-Chun, Lee, Yuan-Chang, Tsai, Wen-Li, Wang, Jen-Chun, Chang, Pai-Cheng, Zhan, Chau-Jie, Lin, Yu-Min, Cheng, Ren-Shin, Ko, Cheng-Ta, Lo, Wei-Chung, Rachel, Yung-Jean Lu
Publikováno v:
2013 8th International Microsystems, Packaging, Assembly & Circuits Technology Conference (IMPACT); 2013, p194-197, 4p
Autor:
Kim, Hee-Joung, Jung, Haijo, Hong, Jin-O, Jeong, Ha-Kyu, Kim, Eun-Kyung, Lee, Kyu-Ho, Seong, Je-Kyung, Je, Jong Ho, Kim, In W., Hwu, Yeukuang, Tsai, Wen-Li, Yoo, Hyung-Sik
Publikováno v:
Proceedings of SPIE; Nov2001, Issue 1, p409-416, 8p
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Publikováno v:
Journal of Nanoparticle Research; Jun2004, Vol. 6 Issue 2, p171-179, 9p
Publikováno v:
Journal of Physics D: Applied Physics; 7/ 7/2002, Vol. 35 Issue 13, pR105-R120, 16p
Publikováno v:
Surface Review & Letters; Feb2002, Vol. 9 Issue 1, p567, 4p