Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Trygve M. Ræder"'
Autor:
Trygve M. Ræder, Shuyu Qin, Michael J. Zachman, Rama K. Vasudevan, Tor Grande, Joshua C. Agar
Publikováno v:
Advanced Science, Vol 9, Iss 29, Pp n/a-n/a (2022)
Abstract Ferroelectrics are being increasingly called upon for electronic devices in extreme environments. Device performance and energy efficiency is highly correlated to clock frequency, operational voltage, and resistive loss. To increase performa
Externí odkaz:
https://doaj.org/article/7a22fcff8dd240b49397bfc801145f96
Autor:
Trygve M. Raeder, Theodor S. Holstad, Inger-Emma Nylund, Mari-Ann Einarsrud, Julia Glaum, Dennis Meier, Tor Grande
Publikováno v:
AIP Advances, Vol 11, Iss 2, Pp 025016-025016-8 (2021)
Ferroelectric properties of films can be tailored by strain engineering, but a wider space for property engineering can be opened by including crystal anisotropy. Here, we demonstrate a huge anisotropy in the dielectric and ferroelectric properties o
Externí odkaz:
https://doaj.org/article/45bd980ff8a447e780a3c0f05ad059e0
Autor:
Mads Carlsen, Trygve M Ræder, Can Yildirim, Raquel Rodriguez-Lamas, Carsten Detlefs, Hugh Simons
Publikováno v:
Carlsen, M, Ræder, T M, Yildirim, C, Rodriguez-Lamas, R, Detlefs, C & Simons, H 2022, ' Fourier ptychographic dark field x-ray microscopy ', Optics Express, vol. 30, no. 2, pp. 2949-2962 . https://doi.org/10.1364/OE.447657
'Optics Express ', vol: 30, pages: 2949-2962 (2022)
'Optics Express ', vol: 30, pages: 2949-2962 (2022)
Dark-field x-ray microscopy (DFXM) is an x-ray imaging technique for mapping three-dimensional (3D) lattice strain and rotation in bulk crystalline materials. At present, these maps of local structural distortions are derived from the raw intensity i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a3773bfeaff588d2aa563fbefaff0629
https://doi.org/10.1364/oe.447657
https://doi.org/10.1364/oe.447657
Publikováno v:
Journal of Physics D: Applied Physics; 5/2/2018, Vol. 51 Issue 17, p1-1, 1p