Zobrazeno 1 - 10
of 140
pro vyhledávání: '"Truche, R."'
Publikováno v:
In Solid State Electronics 2010 54(9):972-978
Autor:
Romanjek, K., Hutin, L., Le Royer, C., Pouydebasque, A., Jaud, M.-A., Tabone, C., Augendre, E., Sanchez, L., Hartmann, J.-M., Grampeix, H., Mazzocchi, V., Soliveres, S., Truche, R., Clavelier, L., Scheiblin, P., Garros, X., Reimbold, G., Vinet, M., Boulanger, F., Deleonibus, S.
Publikováno v:
In Solid State Electronics 2009 53(7):723-729
Autor:
Le Royer, C., Clavelier, L., Tabone, C., Romanjek, K., Deguet, C., Sanchez, L., Hartmann, J.-M., Roure, M.-C., Grampeix, H., Soliveres, S., Le Carval, G., Truche, R., Pouydebasque, A., Vinet, M., Deleonibus, S.
Publikováno v:
In Solid State Electronics September 2008 52(9):1285-1290
Autor:
Delaye, V., Andrieu, F., Aussenac, F., Faynot, O., Truche, R., Carabasse, C., Foucher, A.L., Danel, A., Chabli-Brenac, A.
Publikováno v:
In Microelectronic Engineering May-June 2008 85(5-6):1157-1161
Publikováno v:
In Applied Surface Science 2004 231:668-672
Publikováno v:
In Microelectronic Engineering 2004 72(1):121-124
Publikováno v:
In Applied Surface Science 31 May 2003 214(1-4):359-363
Autor:
COOPER, D.1 david.cooper@cea.fr, TRUCHE, R.1, TWITCHETT-HARRISON, A. C.2, DUNIN-BORKOWSKI, R. E., MIDGLEY, P. A.2
Publikováno v:
Journal of Microscopy. Jan2009, Vol. 233 Issue 1, p102-113. 12p. 4 Diagrams, 2 Charts, 12 Graphs.
Autor:
Vinet, M., Poiroux, T., Widiez, J., Lolivier, J., Previtali, B., Vizioz, C., Guillaumot, B., Besson, P., Simon, J., Martin, F., Maitrejean, S., Holliger, P., Biasse, B., Cassé, M., Allain, F., Toffoli, A., Lafond, D., Hartmann, J.M., Truche, R., Carron, V., Laugier, F., Roman, A., Morand, Y., Renaud, D., Mouis, M., Deleonibus, S.
Publikováno v:
Japanese Journal of Applied Physics
Japanese Journal of Applied Physics, Japan Society of Applied Physics, 2005, xx
Japanese Journal of Applied Physics, Japan Society of Applied Physics, 2005, xx
International audience
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::62e4b40c7672ba525630c7bc1764709e
https://hal.archives-ouvertes.fr/hal-00145312
https://hal.archives-ouvertes.fr/hal-00145312
Autor:
Lemelle, Laurence, Simionovici, Alexandre, Truche, R., Rau, C., Chukalina, Marina, Gillet, Philippe
Publikováno v:
American Mineralogist
American Mineralogist, Mineralogical Society of America, 2004, 89, pp.547
The American Mineralogist
The American Mineralogist, 2004, 89, pp.547
American Mineralogist, Mineralogical Society of America, 2004, 89, pp.547
The American Mineralogist
The American Mineralogist, 2004, 89, pp.547
The combination of synchrotron-based X-ray absorption and fluorescence computed tomographies (CT) is a new method allowing a noninvasive and nondestructive determination of the three-dimensional (3D) mineralogy with micrometer resolution of sub-milli
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::f67a4f42cacf6b1e7fedb3e2819bdbd5
https://hal.archives-ouvertes.fr/hal-00291238
https://hal.archives-ouvertes.fr/hal-00291238