Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Tristan Erion-Lorico"'
Publikováno v:
2022 IEEE 49th Photovoltaics Specialists Conference (PVSC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2463da6d3e8016061922cebf780119de
https://doi.org/10.1109/pvsc48317.2022.9938799
https://doi.org/10.1109/pvsc48317.2022.9938799
Autor:
Joseph Karas, Ingrid Repins, Karl A. Berger, Bernhard Kubicek, Fangdan Jiang, Daqi Zhang, Jean‐Nicolas Jaubert, Ana Belén Cueli, Tony Sample, Bengt Jaeckel, Matthias Pander, Esther Fokuhl, Max B. Koentopp, Friederike Kersten, Jun‐Hong Choi, Birinchi Bora, Chandan Banerjee, Stefan Wendlandt, Tristan Erion‐Lorico, Kenneth J. Sauer, Jon Tsan, Mauro Pravettoni, Mauro Caccivio, Giovanni Bellenda, Christos Monokroussos, Hamza Maaroufi
This paper reports the results of an international interlaboratory comparison study on light- and elevated temperature-induced degradation (LETID) on crystalline silicon photovoltaic (PV) modules. A large global network of PV module manufacturers and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ecb0b98d44924600feff7ec7502ae484
https://publica.fraunhofer.de/handle/publica/425514
https://publica.fraunhofer.de/handle/publica/425514
Autor:
Tristan Erion-Lorico
Publikováno v:
2021 NREL PV Module Reliability Workshop, virtual, 2/20/2021.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8b16c26d616f567d576bffa139a91720
https://doi.org/10.2172/1820398
https://doi.org/10.2172/1820398
Autor:
Tristan Erion-Lorico
Publikováno v:
PV Module Tech, Penang, Malaysia, 10/22/2019.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dd2abfb51e9095fb4b89e0be15ce81b2
https://doi.org/10.2172/1819762
https://doi.org/10.2172/1819762
Autor:
Tristan Erion-Lorico
Publikováno v:
PV ModuleTech 2019, Penang, Malaysia, 10/22/2019.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::75b140bcc59cf4888e8d111fb0a43f15
https://doi.org/10.2172/1820393
https://doi.org/10.2172/1820393