Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Tristan Dewolf"'
Autor:
Joël Kanyandekwe, Matthias Bauer, Tanguy Marion, Lazhar Saidi, Jean-Baptiste Pin, Jeremie Bisserier, Jérôme Richy, Nicolas Gauthier, Pattamon Dezest, Laurent Brunet, Valérie Lapras, Tristan Dewolf, Shawn Thomas, Jean-Michel Hartmann
Publikováno v:
ECS Transactions. 109:121-133
Nowadays, “more Moore” and “more than Moore” device architectures are becoming more and more complex. In CEA-Leti, we work on the “CoolCubeTM” 3D sequential integration which is based on the stacking of FDSOI devices [1]. We present solut
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f8668d9cf667655519a6710cda083aaa
https://doi.org/10.1149/10904.0121ecst
https://doi.org/10.1149/10904.0121ecst
Autor:
Sylvain Misat, Mikhail Loktev, Ralph Schiedon, Jeroen De Boeij, Michiel van der Stam, Chia-Ching Huang, Pierre Sixt, Haidar Al Dujaili, Tristan Dewolf, Nacima Allouti, Laurent Pain, Cyril Vannuffel, Perceval Coudrain, Arnaud Garnier
Publikováno v:
2022 IEEE 24th Electronics Packaging Technology Conference (EPTC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5bc14d64a259520c478421d78ff6282c
https://doi.org/10.1109/eptc56328.2022.10013124
https://doi.org/10.1109/eptc56328.2022.10013124
Autor:
Jonathan Faugier-Tovar, Remi Le Tiec, Shimon Levi, Tristan Dewolf, Angela Kravtsov, Cyril Vannuffel, Cecilia Dupre, Quentin Wilmart, Olga Novak, Stephanie Garcia
Publikováno v:
Smart Photonic and Optoelectronic Integrated Circuits XXIII.
Roughness has always been a key detractor of the optical losses within the silicon photonics devices. With scaling at 300mm wafer, there is an introduction of new tools such immersion lithography scanner, OPC technique that can help to drive furtherm
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ccb55c7d6918d5905eec17b7afd6f2fe
https://doi.org/10.1117/12.2578550
https://doi.org/10.1117/12.2578550
Autor:
Gauthier Lefevre, Tristan Dewolf, Nicolas Guillaume, Serge Blonkowski, Christelle Charpin-Nicolle, Eric Jalaguier, Etienne Nowak, Nicolas Bernier, Tom Blomberg, Marko Tuominen, Hessel Sprey, Guillaume Audoit, Sylvie Schamm-Chardon
Publikováno v:
Journal of Applied Physics
Journal of Applied Physics, 2021, 130 (24), pp.244501. ⟨10.1063/5.0072343⟩
Journal of Applied Physics, 2021, 130 (24), pp.244501. ⟨10.1063/5.0072343⟩
International audience; Metal oxide-based resistive random access memory devices are highly attractive candidates for next-generation nonvolatile memories, butthe resistive switching phenomena remain poorly understood. This article focuses on the mic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0fc9c75e2904caa58ba963d3a81c7c11
https://doi.org/10.1063/5.0072343
https://doi.org/10.1063/5.0072343
Autor:
Tristan Dewolf, Vincent Delaye, Nicolas Bernier, David Cooper, Nicolas Chevalier, Helen Grampeix, Christelle Charpin, Eric Jalaguier, Martin Kogelschatz, Sylvie Schamm-Chardon, Guillaume Audoit
Publikováno v:
16th European Microscopy Congress
16th European Microscopy Congress, 2016, LYON, France
16th European Microscopy Congress, 2016, LYON, France
International audience
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4ec7ade814a62abe33954ecb2aad01e0
https://hal.univ-grenoble-alpes.fr/hal-01882043
https://hal.univ-grenoble-alpes.fr/hal-01882043
