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Modeling Dark Current Conduction Mechanisms and Mitigation Techniques in Vertically Stacked Amorphous Selenium-Based Photodetectors.

Autor: Triet Ho LT; Department of Electrical Engineering, College of Engineering and Applied Sciences, Stony Brook University, Stony Brook, New York 11794, United States., Mukherjee A; Department of Electrical Engineering, College of Engineering and Applied Sciences, Stony Brook University, Stony Brook, New York 11794, United States., Vasileska D; School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, Arizona 85287, United States., Akis J; Department of Radiology, Renaissance School of Medicine, Stony Brook University, Stony Brook, New York 11794, United States., Stavro J; Department of Radiology, Renaissance School of Medicine, Stony Brook University, Stony Brook, New York 11794, United States., Zhao W; Department of Radiology, Renaissance School of Medicine, Stony Brook University, Stony Brook, New York 11794, United States., Goldan AH; Department of Radiology, Renaissance School of Medicine, Stony Brook University, Stony Brook, New York 11794, United States.

Publikováno v: ACS applied electronic materials [ACS Appl Electron Mater] 2021 Aug 24; Vol. 3 (8), pp. 3538-3546. Date of Electronic Publication: 2021 Aug 02.