Zobrazeno 1 - 10
of 13
pro vyhledávání: '"Trey Reece"'
Publikováno v:
IEEE Transactions on Multi-Scale Computing Systems. 3:50-61
In order to combat the growing threat of counterfeit components, this paper describes a technique to fingerprint and identify components based upon the way in which they send and process ICMP, UDP, and TCP network packets. These network fingerprints
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ff987e6781eda0a1cb2f61962b5e389f
https://doi.org/10.1109/tmscs.2016.2631534
https://doi.org/10.1109/tmscs.2016.2631534
Autor:
Trey Reece, William H. Robinson
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 35:357-366
During the design of an integrated circuit, there are several opportunities for adversaries to make malicious modifications or insertions to a design. These attacks, known as hardware Trojans, can have catastrophic effects on a circuit if left undete
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::35f28a74235cbc2413626ce76988eafe
https://doi.org/10.1109/tcad.2015.2459038
https://doi.org/10.1109/tcad.2015.2459038
Autor:
A. F. Witulski, Bharat L. Bhuva, Trey Reece, Rick Wong, S.-J. Wen, S. Jagannathan, T. D. Loveless, Z. J. Diggins, Lloyd W. Massengill, K. Lilja, M. P. King, W.T. Holman, N. J. Gaspard, M. Bounasser
Publikováno v:
IEEE Transactions on Nuclear Science. 60:4368-4373
Heavy-ion experimental results from flip-flops in 180-nm to 28-nm bulk technologies are used to quantify single-event upset trends. The results show that as technologies scale, D flip-flop single-event upset cross sections decrease while redundant st
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b52526a954e37a9a479ee49966e75669
https://doi.org/10.1109/tns.2013.2289745
https://doi.org/10.1109/tns.2013.2289745
Autor:
Trey Reece, Z. J. Diggins, Lloyd W. Massengill, Rick Wong, N. N. Mahatme, T. D. Loveless, N. J. Gaspard, A. F. Witulski, S.-J. Wen, S. Jagannathan, Bharat L. Bhuva
Publikováno v:
IEEE Transactions on Nuclear Science. 60:4394-4398
Capacitive radiation hardening by design (RHBD) techniques to reduce the single-event cross section of flip-flops are shown to be effective at highly scaled technology nodes, especially for the terrestrial environment. Test results for different valu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f12e26d3e7f81c43d8b6e51b86d217f2
https://doi.org/10.1109/tns.2013.2286272
https://doi.org/10.1109/tns.2013.2286272
Autor:
Bharat L. Bhuva, Michael L. Alles, T. D. Loveless, W.T. Holman, Lloyd W. Massengill, Jeffrey S. Kauppila, T. D. Haeffner, Trey Reece, J. D. Rowe, N. M. Atkinson, R. W. Blaine, Dennis R. Ball, S. Jagannathan, N. J. Gaspard, J. R. Ahlbin
Publikováno v:
IEEE Transactions on Nuclear Science. 59:2748-2755
Direct observation of fast-transient single event signatures often involves considerable uncertainty due to the limitations of monitoring circuitry. A built-in-self-test circuit for the measurement of single-event transients (SET) has been implemente
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::82276ab01ffd2e5afd1cb63ed59dbe42
https://doi.org/10.1109/tns.2012.2218257
https://doi.org/10.1109/tns.2012.2218257
Autor:
Trey Reece, T. D. Loveless, Lloyd W. Massengill, Jugantor Chetia, Michael W. McCurdy, Bharat L. Bhuva, S.-J. Wen, David Rennie, S. Jagannathan, Rick Wong
Publikováno v:
IEEE Transactions on Nuclear Science. 58:1008-1014
Neutron- and proton-induced single-event upset cross sections of D- and DICE-Flip/Flops are analyzed for designs implemented in a 40 nm bulk technology node. Neutron and proton testing of the flip/flops show only a 30%-50% difference between D- and D
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::90c996d95bfc82ab20f61c1f3be69e32
https://doi.org/10.1109/tns.2011.2123918
https://doi.org/10.1109/tns.2011.2123918
Publikováno v:
MWSCAS
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a38df13867d4c7386edf772de9842364
https://doi.org/10.1109/mwscas.2014.6908413
https://doi.org/10.1109/mwscas.2014.6908413
Autor:
Trey Reece, William H. Robinson
Publikováno v:
2013 IEEE International Conference on Technologies for Homeland Security (HST).
This study examines the impact of 18 hardware Trojans inserted into an AES (Advanced Encryption Standard) cryptographic circuit in terms of area, leakage power, and dynamic power. These Trojans were supplied from the Trust-HUB repository. This study
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::def409d9969fc0adb7b535a85e65f39f
https://doi.org/10.1109/ths.2013.6699049
https://doi.org/10.1109/ths.2013.6699049
Autor:
W.T. Holman, S. Jagannathan, T. D. Loveless, K. Lilja, N. J. Gaspard, Lloyd W. Massengill, Rick Wong, M. Bounasser, Bharat L. Bhuva, Trey Reece, S.-J. Wen, Z. J. Diggins
Publikováno v:
2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
Experimental angled heavy-ion single-event cross sections for hardened and unhardened flip-flops for technology nodes ranging from 28-nm to 130-nm are compared. Results show that hardened flip-flop cross sections increase at a faster rate with increa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f8820ccea2d78e7625bf6dacd6fe1a36
https://doi.org/10.1109/radecs.2013.6937376
https://doi.org/10.1109/radecs.2013.6937376
Publikováno v:
MWSCAS
This paper presents an extensive study of the timing results for a software implementation of the NIST-recommended elliptic curves over prime fields. We have designed and simulated the important field operations and point operations on NIST-recommend
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c3abc0700831f706dab466717d05d913
https://doi.org/10.1109/mwscas.2013.6674908
https://doi.org/10.1109/mwscas.2013.6674908