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Autor:
Tremoço, Frederico, Gómez-Varela, Ana I., Miranda, Adelaide, Lopez-Garcia, Martin, Silva, Ana G., De Beule, Pieter A.A.
Publikováno v:
In Results in Physics August 2022 39
Atomic Force Microscopy (AFM) has been combined with many optical microscopy techniques to expand the applications and capabilities of both techniques. However, the intense illumination of AFM cantilevers can give rise to a significant temperature in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1437::217ef01e6fbc8635fe4f09046f1a5ecd
https://hdl.handle.net/10362/112988
https://hdl.handle.net/10362/112988
