Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Trejo Rust"'
Autor:
Satish Kodali, Thirukumaran Mahalingam, Edmund Banghart, Felix Beaudoin, Wang Tao, Nuh Yuksek, Shweta Arora, Rohan Deshpande, Trejo Rust, Sushruth Goud Perumalla, Lu Yuan, Lillian Li, Rinus T. P. Lee, Wayne Zhao
Publikováno v:
International Symposium for Testing and Failure Analysis.
Fault localization using both dynamic laser stimulation and emission microscopy was used to localize the failing transistors within the failing scan chain latch on multiple samples. Nanoprobing was then performed and the source to drain leakage in N-
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e7dd178a55cbf1e37a3f63af1c158914
https://doi.org/10.31399/asm.cp.istfa2020p0038
https://doi.org/10.31399/asm.cp.istfa2020p0038
Autor:
Trejo Rust, David McCarthy, Min Dai, Michael Brodfuehrer, Lingjie Wang, Colleen Meagher, Bruce Dyer, Raymond Van Roijen, Michael D. Steigerwalt, Javier Ayala, Gasner Barthold, Jeffery B. Maxson, Randal Bakken
Publikováno v:
2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
A small but persistent signal in wafer slot order was observed at functional test, affecting logic yield. Through wafer slot Randomization at several operations in the route a process step within high-k metal gate formation was suspected to be causin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e03472cd16acdc49d18a862775295e23
https://doi.org/10.1109/asmc.2017.7969251
https://doi.org/10.1109/asmc.2017.7969251