Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Tracy Myers"'
Autor:
Jennifer K. Cheng MD, MPH, Abiola Faniyan MBBS, MPH, Jenny Chan Yuen MSPH, Tracy Myers RN, BSN, CPN, AE-C, Michelle Fleck BS, RN, CPN, Jane Burgess BSN, RN, CPN, Kathryn Williams MS, Rashmi Wijeratne MD, MPH, Romi Webster MD, MPH, Joanne Cox MD, Man Wai Ng DDS, MPH
Publikováno v:
Global Pediatric Health, Vol 6 (2019)
Objective . To describe changes in oral health behaviors following implementation of a nursing intervention targeting children at risk for early childhood caries at an urban 2-site primary care practice. Methods . Nurses used a proprietary Nursing Ca
Externí odkaz:
https://doaj.org/article/d78d00e8155045a2af2f38c834714162
Autor:
Dave Albert, Tracy Myers
Publikováno v:
International Symposium for Testing and Failure Analysis.
This presentation provides an overview of the terminology and concepts associated with semiconductor yield analysis, modeling, and improvement techniques. It compares and contrasts yield models and describes the steps and equipment involved in settin
Autor:
Janevic, Tracy Myers
Publikováno v:
Babybug; Nov/Dec2024, Vol. 30 Issue 9, pC19-C20, 2p, 4 Color Photographs
Autor:
Jeff Hall, Rommel Relos, Gang Liu, Bohumil Janik, Santosh Menon, Derryl Allman, Tracy Myers, Ed Flanigan, Robert Davis, Steven Vandeweghe
Publikováno v:
2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
Products in automotive applications demand polysilicon fuse One-time programmable (OTP) solutions with extremely low failure rates. Fundamental understanding of the programming mechanism and key design/programming factors are indispensable to achievi
Autor:
Jiri Slezak, Chris Kendrick, J.P. Gambino, Y. Watanabe, T. Hirano, K. Ozeki, Michael Cook, Tracy Myers, T. Sano
Publikováno v:
IRPS
High resistance polysilicon resistors have been characterized by DC and pulsed I-V sweep measurements, resistance vs. temperature, and DC and pulsed voltage stress/measurement cycling. The combination of these measurements along with resistor lineari
Autor:
Ales Litschmann, Gavin D. R. Hall, D. Price, Jiri Slezak, Lancelot Ou, J.P. Gambino, Tracy Myers, Troy Clear
Publikováno v:
2017 IEEE International Reliability Physics Symposium (IRPS).
Parametric device shifts occur in a 0.25 μm CMOS sense amp circuit during a High Temperature Operation Life (HTOL) test, due to the positive bias stress on the pMOSFET devices. The positive gate bias from the HTOL stress causes a larger negative shi
Autor:
Tracy Myers
Publikováno v:
Sculpture Review. 59:25-29
Autor:
Thierry Coffi Herve Yao, Yutaka Ota, Agajan Suwhanov, Tracy Myers, Sallie Hose, Matt Comard, Moshe Agam
Publikováno v:
25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC 2014).
This paper presents the challenges of integrating 70V and 45V lateral DMOS transistor modules into a 0.18um base line process. This integration is achieved with minimal impact on baseline process and circuit IP's. Multi-epitaxial stack and Deep Trenc
Autor:
Janevic, Tracy Myers
Publikováno v:
Babybug; Oct2018, Vol. 24 Issue 8, pC19-C20, 2p, 4 Color Photographs