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pro vyhledávání: '"Tracy Meyers"'
Autor:
Dave Albert, Tracy Meyers
Publikováno v:
International Symposium for Testing and Failure Analysis.
This presentation provides an overview of the terminology and concepts associated with semiconductor yield analysis, modeling, and improvement techniques. It compares and contrasts yield models and describes the steps and equipment involved in settin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0e80614d7cc192defc3b6a92051dfbba
https://doi.org/10.31399/asm.cp.istfa2022tpa1
https://doi.org/10.31399/asm.cp.istfa2022tpa1
