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pro vyhledávání: '"Tracy F. Thonn"'
Autor:
Edward C. Rea, Keith Hubbard, Luis A. Spinelli, Yefim Kil, Andrea Caprara, Alan Macleod, Stuart Butterworth, Colin Seaton, Tracy F. Thonn
Publikováno v:
SPIE Proceedings.
We report on the development and testing of a laser system that delivers up to 200 mW of continuous-wave radiation at 198.54 nm in a near diffraction-limited beam, to be used as a source for photolithography mask writing and mask inspection. The sour
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d9fb34188e96d0b7baf78b2f32314011
https://doi.org/10.1117/12.535669
https://doi.org/10.1117/12.535669
Autor:
R. M. A. Azzam, Tracy F. Thonn
Publikováno v:
Applied optics. 23(16)
A design procedure is described to determine the thicknesses of single-layer coatings of a given dielectric on a given metallic substrate so that a specified net phase retardance (and/or a net relative amplitude attenuation) between the p and s polar
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::55013846156eaa759eb6809a5ea61580
https://pubmed.ncbi.nlm.nih.gov/18213070
https://pubmed.ncbi.nlm.nih.gov/18213070
Autor:
Rasheed M. A. Azzam, Tracy F. Thonn
Publikováno v:
Optical Engineering. 24
Multiple-reflection polarizers are designed using a single-reflection p- or s-suppressing polarizing mirror as the basic component, with the constraint that all mirrors be made of the same metallic substrate coated by the same dielectric film. Result
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1e8503b166eede2330706aee489757c7
https://doi.org/10.1117/12.7973450
https://doi.org/10.1117/12.7973450
Autor:
Tracy F. Thonn, R. M. A. Azzam
Publikováno v:
Applied optics. 22(24)
The pseudo-Brewster angle of minimum reflectance for the p polarization, the corresponding angle for the s polarization, and the second-Brewster angle of minimum ratio of the p and s reflectances are all determined as functions of the thickness of a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9622f12589c94ab620d3b434a5ea0e17
https://pubmed.ncbi.nlm.nih.gov/18200327
https://pubmed.ncbi.nlm.nih.gov/18200327
Autor:
C. K. Carniglia, Tracy F. Thonn, V. A. Hodgkin, T. Tuttle Hart, Jean-Pierre Borgogno, D. M. Quinn, R. M. Swenson, Emile Pelletier, Ursula J. Gibson, J. A. Dobrowolski, P. A. Temple, Jean M. Bennett, F. C. Ho, Martin Purvis, W. P. Klapp, D. P. Arndt, R. M. A. Azzam, H. A. Macleod, W. E. Case, D. H. Strome
Publikováno v:
Applied Optics. 23:3571
The seven participating laboratories received films of two different thicknesses of Sc2O3 and Rh. All samples of each material were prepared in a single deposition run. Brief descriptions are given of the various methods used for determination of the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::66f2117ab8377ff65874e9c5ac67b26e
https://doi.org/10.1364/ao.23.003571
https://doi.org/10.1364/ao.23.003571
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