Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Tracy D. Berman"'
Publikováno v:
Scientific Reports, Vol 14, Iss 1, Pp 1-13 (2024)
Abstract Dark-field X-ray microscopy (DFXM) is a high-resolution, X-ray-based diffraction microstructure imaging technique that uses an objective lens aligned with the diffracted beam to magnify a single Bragg reflection. DFXM can be used to spatiall
Externí odkaz:
https://doaj.org/article/9f4ed7af1820489a9b8e766715bd1a0c
Publikováno v:
Metallurgical and Materials Transactions A. 53:2730-2742
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::50aaf9098622b5b18d9820db6f931f3d
https://doi.org/10.1007/s11661-022-06702-5
https://doi.org/10.1007/s11661-022-06702-5
Autor:
Reza Roumina, Sangwon Lee, Tracy D. Berman, Katherine S. Shanks, John E. Allison, Ashley Bucsek
Publikováno v:
Acta Materialia. 234:118039
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1fa0873556189915241434e91fbe5ba0
https://doi.org/10.1016/j.actamat.2022.118039
https://doi.org/10.1016/j.actamat.2022.118039
Autor:
Darick J. Baker, Emily Przekwas, Tracy D. Berman, C. G. Allen, Dana C. Olson, Thomas E. Furtak, Matthew R. Bergren, David S. Ginley, Jamie M. Albin, Reuben T. Collins, Matthew S. White
Publikováno v:
Materials Research Society Symposium Proceedings.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2669869db6c6122075210b87b5515721
https://doi.org/10.1557/proc-1115-h08-23
https://doi.org/10.1557/proc-1115-h08-23