Investigation of quantum-dimensional structure parameters by X-ray optical, scanning tunneling and transmission electron microscopy

Autor: Touryanski, A. G., Senkov, V. M., Gizha, S. S., Arapkina, L. V., Chapnin, V. A., Chizh, K. V., Kalinushkin, V. P., Storozhevykh, M. S., Uvarov, O. V., Yuryev, V. A.

Publikováno v: Proc. 21th Int. Symp. "Nanostructures: Physics and Technology", Saint Petersburg, Russia, June 24-28, 2013; Academic University Publishing, St. Petersburg, Russia, 2013, pp. 166-167

Application of the two-wavelength X-ray reflectometry to exploration of Ge/Si(001) hereostructures with dense chains of stacked Ge quantum dots is presented
Comment: 21st Int. Symp. "Nanostructures: Physics and Technology"; Saint Petersburg, Rus

Externí odkaz: http://arxiv.org/abs/1304.0955

Investigation of ion-implanted layers by x-ray reflectometry method.

Autor: Touryanski, A. G., Gerasimenko, N. N., Aprelov, S. A., Pirshin, I. V., Poprygo, A. I., Senkov, V. M.

Publikováno v: Proceedings of SPIE; Nov2005 Part 2, Issue 1, p59430G-59430G-7, 7p

Investigation of Surface Phase Layers on GaAs after Selective Chemical Etching

Autor: Zarubina, Oksana N., Mokrousov, Gennady M., Touryanski, Alexander G., Pirshin, Igor V., Maliy, Liubov V.

Publikováno v: Advanced Materials Research; February 2015, Vol. 1085 Issue: 1 p91-94, 4p

Two-channel X-ray reflectometer

Autor: Touryanski, A. G., Vinogradov, A. V., Pirshin, I. V.

Publikováno v: Nuclear Instruments and Methods in Physics Research Section A; 2000, Vol. 448 Issue: 1 p184-187, 4p