Výsledky vyhledávání - "Toshiyuki Syo"

Exhaustive and Systematic Accuracy Verification and Enhancement of STI Stress Compact Model for General Realistic Layout Patterns

Autor: Toshiyuki Syo, Hisao Yoshimura, Toshiki Kanamoto, Masaru Ito, Shigetaka Kumashiro, Kenta Yamada, Tatsuya Kunikiyo

Publikováno v: IEICE Transactions on Electronics. :1349-1358

Layout-aware compact models proposed so far have been generally verified only for simple test patterns. However, real designs use much more complicated layout patterns. Therefore, models must be verified for such patterns to establish their practical

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::8867dbf9e2924155611aee1f89e81b43
https://doi.org/10.1587/transele.e93.c.1349

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