Zobrazeno 1 - 10
of 36
pro vyhledávání: '"Toshiro Tsukada"'
Autor:
Kazuya Matsuzawa, T. Hoshida, Masataka Miyake, Y. Sahara, Takahiro Iizuka, Hans Jurgen Mattausch, U. Feldmann, D. Hori, Mitiko Miura-Mattausch, Norio Sadachika, Toshiro Tsukada
Publikováno v:
IEICE Transactions on Electronics. :608-615
We analyze the carrier dynamics in MOSFETs under low-voltage operation. For this purpose the displacement (charging/discharging) current, induced during switching operations is studied experimentally and theoretically for a 90nm CMOS technology. It i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c1b17a12ec661e3f18f35dbf6fadeaa3
https://doi.org/10.1587/transele.e92.c.608
https://doi.org/10.1587/transele.e92.c.608
Autor:
Hiroki Wada, Haruo Kobayashi, Akira Hayakawa, Atsushi Wada, Masao Hotta, Toshiro Tsukada, Junya Kudoh, Kouichi Yahagi, Hiroyuki Hagiwara, Hideo Nakane, Tatsuji Matsuura, Koichiro Mashiko, Hao San, Yoshitaka Jingu
Publikováno v:
IEICE Transactions on Electronics. :1181-1188
We have designed, fabricated and measured a second-order multibit switched-capacitor complex bandpass ΔΣAD modulator to evaluate our new algorithms and architecture. We propose a new structure of a complex bandpass filter in the forward path with I
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::49b28d09275af7348ab24bad51f263bd
https://doi.org/10.1093/ietele/e90-c.6.1181
https://doi.org/10.1093/ietele/e90-c.6.1181
Autor:
Masao Hotta, Haruo Kobayashi, Atsushi Wada, Masafumi Uemori, Tomonari Ichikawa, Koichiro Mashiko, Toshiro Tsukada
Publikováno v:
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. :916-923
This paper proposes a continuous-time bandpass ΔΣAD modulator architecture which performs high-accuracy AD conversion of high frequency analog signals and can be used for next-generation radio systems. We use an RF DAC inside the modulator to enabl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::001da2a38645ef1e342a1ebc20668cf4
https://doi.org/10.1093/ietfec/e89-a.4.916
https://doi.org/10.1093/ietfec/e89-a.4.916
Autor:
Yasuo Itoh, Haruki Toda, Masato Hagiwara, Toshiro Tsukada, Yukio Arima, Motoi Ichihashi, Yasuyuki Hashimoto, Hiroyuki Okada, Tetsuya Fujimoto, Yoshihide Komatsu, Minematsu Isao, Takahiro Yamashita, Koichiro Ishibashi, Kohji Sakata
Publikováno v:
IEICE Transactions on Electronics. :250-262
Circuit techniques for realizing low-voltage and low-power SoCs for 90-nm CMOS technology and beyond are described. A proposed SAFBB (self-adjusted forward body bias techniques), ATC (Asymmetric Three transistor Cell) DRAM, and ADC using an offset ca
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::275c3007d0c8c15721e4bce28e8e3875
https://doi.org/10.1093/ietele/e89-c.3.250
https://doi.org/10.1093/ietele/e89-c.3.250
Publikováno v:
Analog Integrated Circuits and Signal Processing. 25:299-307
In this paper, we present an efficient approach for technology scaling of MOS analog circuits by using circuit optimization techniques. Our new method is based on matching equivalent circuit parameters between a previously designed circuit and the ci
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1dad7777e274685f3b9921f0edf883d5
https://doi.org/10.1023/a:1008382032352
https://doi.org/10.1023/a:1008382032352
Publikováno v:
IEEE Transactions on Instrumentation and Measurement. 48:1068-1072
In mixed-signal integrated circuits (IC's), substrate noise produced by high-speed digital circuits passes to the on-chip analog circuits through the substrate and seriously degrades their performance. We have developed a method for measuring the sub
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::19ce667b1f70d5fc486940dfa5965563
https://doi.org/10.1109/19.816115
https://doi.org/10.1109/19.816115
Measurement of substrate noise in CMOS integrated circuits by using chopper‐type voltage comparators
Publikováno v:
Electronics and Communications in Japan (Part II: Electronics). 81:59-66
It is important to reduce substrate noise in the analog/digital mixed-signal integrated circuits. In order to understand the influence of substrate noise, a technique to measure substrate noise using a chopper-type voltage comparator based on an equi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ecffc92e236b526c96e782fda8809c11
https://doi.org/10.1002/(sici)1520-6432(199805)81:5<59::aid-ecjb8>3.0.co
https://doi.org/10.1002/(sici)1520-6432(199805)81:5<59::aid-ecjb8>3.0.co
Publikováno v:
Electronics and Communications in Japan (Part II: Electronics). 78:79-89
A circuit technique is proposed for reducing the offset voltage due to feedthrough charges from the MOS switches in the CMOS autozeroed chopper-type comparators. However, unavoidable offset voltages are generated if many comparators of this kind are
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3f5afcaee10ef8bc70e11c79378e9a8f
https://doi.org/10.1002/ecjb.4420780408
https://doi.org/10.1002/ecjb.4420780408
Autor:
Norio Sadachika, Hans Jurgen Mattausch, Kazuya Matsuzawa, Takahiro Iizuka, Y. Sahara, Toshiro Tsukada, D. Hori, T. Hoshida, Masataka Miyake, Mitiko Miura-Mattausch
Publikováno v:
Extended Abstracts of the 2009 International Conference on Solid State Devices and Materials.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4471d495ca58dfa5bd4a9a2f7e232612
https://doi.org/10.7567/ssdm.2009.a-5-4
https://doi.org/10.7567/ssdm.2009.a-5-4
Autor:
Makoto Nagata, Koichiro Ishibashi, Mitsuya Fukazawa, Kenji Shimazaki, Yoshihide Komatsu, M. Yamamoto, Toshiro Tsukada
Publikováno v:
CICC
We propose a method of reducing substrate noise and random fluctuations utilizing a self-adjusted forward body bias (SA-FBB) circuit. To achieve this, we designed a test chip that contained an on-chip oscilloscope for detecting dynamic noise from var
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c5f607fc8d8175fc3970da733b3f49b9
https://doi.org/10.1109/cicc.2005.1568601
https://doi.org/10.1109/cicc.2005.1568601