Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Toshiko Takatsuka"'
Autor:
Toshiko Takatsuka, Yanbei Zhu, Akira Kurokawa, Tomoko Ariga, Kazumi Inagaki, Mika Ito, Shinya Terauchi
Publikováno v:
Analytical and Bioanalytical Chemistry. 410:2849-2857
Area densities of Au/Ni/Cu layers on a Cr-coated quartz substrate were characterized to certify a multiple-metal-layer certified reference material (NMIJ CRM5208-a) that is intended for use in the analysis of the layer area density and the thickness
Autor:
Akira Kurokawa, Yasushi Azuma, Akio Takano, Shinya Terauchi, Junichiro Sameshima, Toshiko Takatsuka, Seiichiro Mizuno, Tomohiro Narukawa
Publikováno v:
e-Journal of Surface Science and Nanotechnology. 14:125-130
Publikováno v:
RADIOISOTOPES. 59:581-586
Autor:
Toshiko Takatsuka, Kouichi Hirata, Yoshinori Kobayashi, Takayoshi Kuroiwa, Tsutomu Miura, Hideaki Matsue, Edmund G. Seebauer, Susan B. Felch, Amitabh Jain, Yevgeniy V. Kondratenko
Publikováno v:
ResearcherID
Certified reference materials (CRMs) of shallow arsenic implants in silicon are now under development at the National Metrology Institute of Japan (NMIJ). The amount of ion‐implanted arsenic atoms is quantified by Instrumental Neutron Activation An