Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Toshihide Seki"'
Publikováno v:
Applied Surface Science. :231-236
Electron spin resonance (ESR) method was used to investigate defects produced in SIMOX by As+ and B+ ion implantation. Two kinds of paramagnetic defect centers were observed. One had a g-value of 2.0055 and ΔHpp= 7.0 Oe, due to a-center, which origi
Publikováno v:
Materials Science Forum. :813-816