Zobrazeno 1 - 10
of 14
pro vyhledávání: '"Toshiaki Hatano"'
Autor:
Thang Nguyen, Toshiaki Hatano, Said G. Khan, Kaiqiang Zhang, Christopher Edwards, Robert Harniman, Stuart C. Burgess, Massimo Antognozzi, Mervyn Miles, Guido Herrmann
Publikováno v:
AIP Advances, Vol 5, Iss 9, Pp 097157-097157-9 (2015)
In this paper, the problem of estimating the shear force affecting the tip of the cantilever in a Transverse Dynamic Force Microscope (TDFM) using a real-time implementable sliding mode observer is addressed. The behaviour of a vertically oriented os
Externí odkaz:
https://doaj.org/article/4d5721d0549247baa02292017abc70ac
Publikováno v:
2023 IEEE/SICE International Symposium on System Integration (SII).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::600715b0f0548d06e126833a67e0cd5f
https://doi.org/10.1109/sii55687.2023.10039387
https://doi.org/10.1109/sii55687.2023.10039387
Autor:
Guido Herrmann, Toshiaki Hatano, Kaiqiang Zhang, Christopher Edwards, Stuart C Burgess, Mervyn J Miles, Thang Nguyen, Massimo Antognozzi
Publikováno v:
Zhang, K, Hatano, T, Herrmann, G, Antognozzi, M, Edwards, C, Nguyen Tien, T, Burgess, S & Miles, M 2019, ' A Multi-mode Transverse Dynamic Force Microscope-Design, Identification and Control ', IEEE Transactions on Industrial Electronics . https://doi.org/10.1109/TIE.2019.2924618
The transverse dynamic force microscope (TDFM) and its shear force sensing principle permit true non-contact force detection in contrast to typical atomic force microscopes. The two TDFM measurement signals for the cantilever allow, in principle, two
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5e6ecc889ff26bd09cea1ff67ece350f
https://doi.org/10.1109/tie.2019.2924618
https://doi.org/10.1109/tie.2019.2924618
Autor:
Stuart C Burgess, Robert L. Harniman, Christopher Edwards, Toshiaki Hatano, Massimo Antognozzi, Guido Herrmann, Mervyn J Miles, Said Ghani Khan, Thang Nguyen, Kaiqiang Zhang
Publikováno v:
Zhang, K, Hatano, T, Nguyen, T, Edwards, C, Herrmann, G, Burgess, S, Antognozzi, M, Khan, S, Harniman, R & Miles, M 2020, ' A super-twisting observer for atomic-force reconstruction in a probe microscope ', Control Engineering Practice, vol. 94, 104191 . https://doi.org/10.1016/j.conengprac.2019.104191
Zhang, K, Hatano, T, Tien Nguyen, T, Edwards, C, Herrmann, G, Burgess, S, Antognozzi, M, Khan, S, Harniman, R & Miles, M 2020, ' A super-twisting observer for atomic-force reconstruction in a probe microscope ', Control Engineering Practice, vol. 94, 104191 . https://doi.org/10.1016/j.conengprac.2019.104191
Zhang, K, Hatano, T, Tien Nguyen, T, Edwards, C, Herrmann, G, Burgess, S, Antognozzi, M, Khan, S, Harniman, R & Miles, M 2020, ' A super-twisting observer for atomic-force reconstruction in a probe microscope ', Control Engineering Practice, vol. 94, 104191 . https://doi.org/10.1016/j.conengprac.2019.104191
This paper presents a new methodology, employing a super-twisting sliding mode observer, to reconstruct un-measureable atomic-forces at nano-Newton precision in a Vertically Oriented Probe Microscope (VOPM). The VOPM senses the deflection of a vertic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::799158d8d9b1ee7c7b200274c3ec87ee
https://pure.manchester.ac.uk/ws/files/142227157/CONENGPRAC_D_19_00164R1_plain.pdf
https://pure.manchester.ac.uk/ws/files/142227157/CONENGPRAC_D_19_00164R1_plain.pdf
Autor:
Stuart C Burgess, Toshiaki Hatano, Christopher Edwards, Said Ghani Khan, Guido Herrmann, Thang Nguyen, Mervyn J Miles, Kaiqiang Zhang, G. De Silva
Publikováno v:
De Silva, G, Burgess, S C, Hatano, T, Khan, S G, Zhang, K, Nguyen, T, Herrmann, G, Edwards, C & Miles, M 2017, ' Optimisation of a nano-positioning stage for a Transverse Dynamic Force Microscope ', Precision Engineering-Journal of the International Societies for Precision Engineering and Nanotechnology, vol. 50, 1, pp. 183-197 . https://doi.org/10.1016/j.precisioneng.2017.05.005
De Silva, G, Burgess, S C, Hatano, T, Khan, S G, Zhang, K, Nguyen, T, Herrmann, G, Edwards, C & Miles, M 2017, ' Optimisation of a nano-positioning stage for a Transverse Dynamic Force Microscope ', Precision Engineering, vol. 50, pp. 183-197 . https://doi.org/10.1016/j.precisioneng.2017.05.005
De Silva, G, Burgess, S C, Hatano, T, Khan, S G, Zhang, K, Nguyen, T, Herrmann, G, Edwards, C & Miles, M 2017, ' Optimisation of a nano-positioning stage for a Transverse Dynamic Force Microscope ', Precision Engineering, vol. 50, pp. 183-197 . https://doi.org/10.1016/j.precisioneng.2017.05.005
This paper describes the optimisation of a nano-positioning stage for a Transverse Dynamic Force Microscope (TDFM). The nano-precision stage is required to move a specimen dish within a horizontal region of 1 μm × 1 μm and with a resolution of 0.3
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5c2b0ba32332bbaf0b252892dadeca2e
https://doi.org/10.1016/j.precisioneng.2017.05.005
https://doi.org/10.1016/j.precisioneng.2017.05.005
Autor:
Mervyn J Miles, Thang Nguyen Tien, Massimo Antognozzi, Kaiqiang Zhang, Christopher Edwards, Toshiaki Hatano, Guido Herrmann, Stuart C Burgess, Robert L. Harniman, Said Ghani Khan
Publikováno v:
Asian Journal of Control. 20:1317-1328
This paper describes a sliding mode observer scheme for estimation of the shear force affecting the cantilever in a Transverse Dynamic Force Microscope (TDFM). The vertically oriented cantilever is oscillated in the proximity to the specimen under in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e8b430f12d28521b19be68a18e018f91
https://doi.org/10.1002/asjc.1416
https://doi.org/10.1002/asjc.1416
Autor:
Kaiqiang Zhang, Toshiaki Hatano, Thang Nguyen Tien, Said Ghani Khan, Mervyn J Miles, G. De Silva, Christopher Edwards, Guido Herrmann, Stuart C Burgess
Publikováno v:
IFAC-PapersOnLine. 49:120-126
This paper presents the design process for the optimisation of a nano-precision actuation stage for a Transverse Dynamic Force Microscope (TDFM). A TDFM is an advanced type of Atomic Force microscope (AFM) that does not contact the specimen and there
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ff03a7b47c07314f8d1af59da390b120
https://doi.org/10.1016/j.ifacol.2016.10.524
https://doi.org/10.1016/j.ifacol.2016.10.524
Autor:
Guido Herrmann, Kaiqiang Zhang, Said Ghani Khan, Mervyn J Miles, Christopher Edwards, Stuart C Burgess, Thang Nguyen, Toshiaki Hatano
Publikováno v:
ACC
Hatano, T, Zhang, K, Khan, S, Nguyen Tien, T, Herrmann, G, Edwards, C, Burgess, S & Miles, M 2016, A Specimen-Tracking Controller for the Transverse Dynamic Force Microscope in Non-Contact Mode . in 2016 American Control Conference (ACC 2016) : Proceedings of a meeting held at July 6–8, Boston, MA, USA ., 7526838, Proceedings of the American Control Conference (ACC), Institute of Electrical and Electronics Engineers (IEEE), pp. 7384-7389, 2016 American Control Conference, ACC 2016, Boston, United States, 6/07/16 . https://doi.org/10.1109/ACC.2016.7526838
Hatano, T, Zhang, K, Khan, S, Nguyen Tien, T, Herrmann, G, Edwards, C, Burgess, S & Miles, M 2016, A Specimen-Tracking Controller for the Transverse Dynamic Force Microscope in Non-Contact Mode . in 2016 American Control Conference (ACC 2016) : Proceedings of a meeting held at July 6–8, Boston, MA, USA ., 7526838, Proceedings of the American Control Conference (ACC), Institute of Electrical and Electronics Engineers (IEEE), pp. 7384-7389, 2016 American Control Conference, ACC 2016, Boston, United States, 6/07/16 . https://doi.org/10.1109/ACC.2016.7526838
This paper presents results from the practical implementation of a specimen tracking controller for the transverse dynamic force microscope (TDFM). Uniquely, in the TDFM, the scanning cantilever is vertically oriented. It can be controlled in the ver
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1ab95a0a991a79a75a83eb448ddc7bc7
https://doi.org/10.1109/acc.2016.7526838
https://doi.org/10.1109/acc.2016.7526838
Autor:
Toshiaki Hatano, Stuart C Burgess, Guido Herrmann, Thang Nguyen Tien, Christopher Edwards, Mervyn J Miles
Publikováno v:
2015 IEEE International Symposium on Intelligent Control (ISIC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c85f444d630bf843a8600ab7fcb8e5b3
https://doi.org/10.1109/isic.2015.7307292
https://doi.org/10.1109/isic.2015.7307292
Publikováno v:
UKACC International Conference on CONTROL 2010.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::507bbbd575d572de90ac87cb0780bd90
https://doi.org/10.1049/ic.2010.0313
https://doi.org/10.1049/ic.2010.0313