Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Toru Anezaki"'
Autor:
S. Logie, Steven Fong, D. Rutledge, Kazutaka Yoshizawa, Toru Anezaki, R. Smoak, Junichi Ariyoshi, S. Mehta, Hideyuki Kojima, H. Ogawa, Taiji Ema
Publikováno v:
2007 IEEE International Electron Devices Meeting.
We have successfully integrated an embedded flash technology into a 90 nm leading edge logic technology to realize superior FPGA products with only 10% additional process steps. The stacked gate memory cell is completely compatible with Cu and a low-
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fd9873b31ae04d37718dca5afe77d4b1
https://doi.org/10.1109/iedm.2007.4419036
https://doi.org/10.1109/iedm.2007.4419036
