Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Torben M. Hansen"'
Autor:
Braulio Beltrán-Pitarch, Benny Guralnik, Neetu Lamba, Andreas R. Stilling-Andersen, Lars Nørregaard, Torben M. Hansen, Ole Hansen, Nini Pryds, Peter F. Nielsen, Dirch H. Petersen
Publikováno v:
Beltrán-Pitarch, B, Guralnik, B, Lamba, N, Stilling-Andersen, A R, Nørregaard, L, Hansen, T M, Hansen, O, Pryds, N, Nielsen, P F & Petersen, D H 2023, ' Determination of thermal diffusivity of thermoelectric materials using a micro four-point probe method ', Materials Today Physics, vol. 31, 100963 . https://doi.org/10.1016/j.mtphys.2022.100963
To develop materials with higher thermoelectric efficiency, a comprehensive characterization of material properties on the relevant spatial scales is pertinent. In this study, we develop a new method based on a micro four-point probe (M4PP) to determ
Publikováno v:
Microelectronic Engineering. 85:1092-1095
In recent years micro four-point probes (M4PP) have proved a powerful tool for electrical characterization of thin film due to a high surface sensitivity and spatial resolution. However, a common problem is the probe lifetime which is limited mainly
Publikováno v:
International Journal of Refrigeration. 28:83-91
In recent years, a lot of important work has been carried out in order to gather knowledge of the fundamental behaviour of ice slurry in piping systems and heat exchangers. The scope of this work has been to bring ice slurry one step closer to practi
Publikováno v:
HVAC&R Research. 9:19-32
The physical properties and practical application of solid-liquid suspensions are influenced by, among other factors, the size and shape of the solid particles. In the case of ice slurry, this influence is especially visible with respect to fluid dyn
Autor:
ICHIRO SHIRAKI, TADAAKI NAGAO, SHUJI HASEGAWA, CHRISTIAN L. PETERSEN, PETER BØGGILD, TORBEN M. HANSEN, FRANÇOIS HANSEN
Publikováno v:
Surface Review and Letters. :533-537
For in-situ measurements of surface conductivity in ultrahigh vacuum (UHV), we have installed micro-four-point probes (probe spacings down to 4 μm) in a UHV scanning electron microscope (SEM) combined with scanning reflection–high-energy electron
Autor:
L. Montelius, Kristian Mølhave, J. Richter, M.O. Jensen, Torben M. Hansen, Francois Grey, A. Hyldgard, Peter Bøggild
Publikováno v:
Bøggild, P, Hansen, T M, Mølhave, K, Hyldgård, A, Jensen, M O, Richter, J, Montelius, L & Grey, F 2001, Customizable nanotweezers for manipulation of free-standing nanostructures . in Proceedings of The 2001 1st IEEE Conference on Nanotechnology . IEEE, pp. 87-92, 1st IEEE Conference on Nanotechnology, Maui, Hawaii, United States, 30/10/2001 . https://doi.org/10.1109/NANO.2001.966399
We present a novel nanotweezer device for manipulation and measurement of free-standing nanostructures, where the shape of the tweezer tips can be customized for the application. Electrostatic actuators with submicron interelectrode spacings are fabr