Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Torben Heins"'
Publikováno v:
PLOS Global Public Health, Vol 3, Iss 5, p e0001018 (2023)
COVID-19 pandemic puts an enormous strain on health care systems worldwide and may have a detrimental effect on prevention, treatment and outcomes of tuberculosis (TB), viral hepatitis, HIV/AIDS and malaria, whose ending is part of the United Nations
Externí odkaz:
https://doaj.org/article/aca1421fa4c447a199808db1bec63587
Autor:
Torben Heinsohn, Berit Lange, Patrizio Vanella, Isti Rodiah, Stephan Glöckner, Alexander Joachim, Dennis Becker, Tobias Brändle, Stefan Dhein, Stefan Ehehalt, Mira Fries, Annette Galante-Gottschalk, Stefanie Jehnichen, Sarah Kolkmann, Annelene Kossow, Martin Hellmich, Jörg Dötsch, Gérard Krause
Publikováno v:
PLoS Medicine, Vol 19, Iss 12, p e1003913 (2022)
BackgroundSchool-level infection control measures in Germany during the early Coronavirus Disease 2019 (COVID-19) pandemic differed across the 16 federal states and lacked a dependable evidence base, with available evidence limited to regional data r
Externí odkaz:
https://doaj.org/article/7e8c7b43f1ed4da793dd1e57f7db7540
Autor:
Florian Letzkus, Christian Chovino, Torben Heins, Rico Buettner, Uwe Dersch, Holger Herguth, Joerg Butschke, Jan Hendrik Peters, Thomas Rode, Steffen Franz, Mathias Irmscher
Publikováno v:
SPIE Proceedings.
In the framework of the European EXTUMASK project, the Advanced Mask Technology Center in Dresden (AMTC) has established in close collaboration with the Institute of Microelectronics in Stuttgart (IMS-Chips) an integrated mask process suited to manuf
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1b74b4616dfe429c473a3b1a587efe98
https://doi.org/10.1117/12.686035
https://doi.org/10.1117/12.686035
Publikováno v:
SPIE Proceedings.
The precise targeting of critical dimension (CD) features on photolithographic masks is an essential part of the mask production process. It is straight forward that the usual decrease of specification numbers can only be achieved using cutting edge
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::488de38d8c636b717090223dc034357b
https://doi.org/10.1117/12.681867
https://doi.org/10.1117/12.681867
Publikováno v:
SPIE Proceedings.
Line edge roughness (LER) has become a standard topic in the semiconductor industry for its possible yield impact on wafer production. Recently a number of studies address its measurement process to increase the reliability of results. Here, we inves
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3bb3bc635d3929e3af2536b5e53b35e8
https://doi.org/10.1117/12.655531
https://doi.org/10.1117/12.655531
Publikováno v:
BMJ Open, Vol 11, Iss 11 (2021)
Objective To summarise the comparative risk of infection in school staff and their contribution to SARS-CoV-2 transmission.Design Systematic review using Preferred Reporting Items for Systematic Reviews and Meta-Analyses guideline.Data sources MEDLIN
Externí odkaz:
https://doaj.org/article/097aea0d21c14153bc24314111fa4391