Zobrazeno 1 - 10
of 336
pro vyhledávání: '"Toperverg, B"'
Autor:
Mishra, D., Greving, D., Confalonieri, G. A. Badini, Perlich, J., Toperverg, B. P., Zabel, H., Petracic, O.
Publikováno v:
Nanotechnology 25 (2014) 205602
We report about the fabrication and characterization of iron oxide nanoparticle thin film superlattices. The formation into different film morphologies is controlled by tuning the particle plus solvent-to-substrate interaction. It turns out that the
Externí odkaz:
http://arxiv.org/abs/1307.4693
Autor:
Uribe-Laverde, M. A., Satapathy, D. K., Marozau, I., Malik, V. K., Das, S., Sen, K., Stahn, J., Rühm, A., Kim, J. -H., Keller, T., Devishvili, A., Toperverg, B. P., Bernhard, C.
Publikováno v:
Phys. Rev. B 87, 115105 (2013)
Using polarized neutron reflectometry (PNR) we have investigated a YBa2Cu3O7(10nm)/La2/3Ca1/3MnO3(9nm)]10 (YBCO/LCMO) superlattice grown by pulsed laser deposition on a La0.3Sr0.7Al0.65Ta0.35O3 (LSAT) substrate. Due to the high structural quality of
Externí odkaz:
http://arxiv.org/abs/1212.0986
Autor:
Satapathy, D. K., Uribe-Laverde, M. A., Marozau, I., Malik, V. K., Das, S., Wagner, Th., Marcelot, C., Stahn, J., Brück, S., Rühm, A., Macke, S., Tietze, T., Goering, E., Frañó, A., Kim, J. -H., Wu, M., Benckiser, E., Keimer, B., Devishvili, A., Toperverg, B. P., Merz, M., Nagel, P., Schuppler, S., Bernhard, C.
Publikováno v:
Phys. Rev. Lett. 108, 197201 (2012)
Using neutron reflectometry and resonant x-ray techniques we studied the magnetic proximity effect (MPE) in superlattices composed of superconducting YBa$_2$Cu$_3$O$_7$ (YBCO) and ferromagnetic-metallic (FM-M) La$_{0.67}$Ca$_{0.33}$MnO$_{3}$ (LCMO) o
Externí odkaz:
http://arxiv.org/abs/1111.5772
Autor:
Hamann, C., Toperverg, B. P., Theis-Bröhl, K., Wolff, M., Kaltofen, R., Mönch, I., McCord, J., Schultz, L.
The magnetization reversal in stripe-like exchange bias patterned $\rm Ni_{81}Fe_{19}/IrMn$ thin films was investigated by complementary inductive and high resolution magneto optical magnetometry, magneto optical Kerr microscopy, and polarized neutro
Externí odkaz:
http://arxiv.org/abs/0911.0559
Autor:
Theis-Broehl, K., Westphalen, A., Zabel, H., Ruecker, U., McCord, J., Hoeink, V., Schmalhorst, J., Reiss, G., Weis, T., Engel, D., Ehresmann, A., Toperverg, B. P.
A combination of experimental techniques, e.g. vector-MOKE magnetometry, Kerr microscopy and polarized neutron reflectometry, was applied to study the field induced evolution of the magnetization distribution over a periodic pattern of alternating ex
Externí odkaz:
http://arxiv.org/abs/0803.2144
Autor:
Lee, W. -T., Velthuis, S. G. E. te, Felcher, G. P., Klose, F., Gredig, T., Dahlberg, D., Toperverg, B. V.
Polarized neutron reflectometry (PNR) has long been applied to measure the magnetic depth profile of thin films. In recent years, interest has increased in observing lateral magnetic structures in a film. While magnetic arrays patterned by lithograph
Externí odkaz:
http://arxiv.org/abs/cond-mat/0210124
Publikováno v:
In Physica B: Physics of Condensed Matter 2009 404(17):2553-2556
Publikováno v:
In Physica B: Physics of Condensed Matter 2006 385 Part 1:471-474
Autor:
Lauter V; Neutron Scattering Division, Neutron Sciences Directorate, Oak Ridge National Laboratory, 1 Bethel Valley Road, Oak Ridge, Tennessee 37831, USA., Wang K; Department of Electrical and Computer Engineering, Department of Physics, Department of Materials Science and Engineering, University of California, Los Angeles, California 90095, USA., Mewes T; Magnetics Laboratory, Department of Physics and Astronomy, The University of Alabama, 1008 Bevill Bldg., Tuscaloosa, Alabama 3548, USA., Glavic A; Laboratory for Neutron and Muon Instrumentation, Paul Scherrer Institut, 5232 Villigen PSI, Switzerland., Toperverg B; Department of Solid State Physics, Experimental Physics, Ruhr-University Bochum, Universitetsstrasse 150, Bochum D-44781, Germany., Ahmadi M; Department of Materials Science and Engineering, Institute for Advanced Materials and Manufacturing, University of Tennessee, 2641 Osprey Vista Way, Knoxville, Tennessee 37920, USA., Assaf B; 225 Nieuwland Science Center, University of Notre Dame, Notre Dame, Indiana 46556, USA., Hu B; Department of Materials Science and Engineering, Institute for Advanced Materials and Manufacturing, University of Tennessee, 2641 Osprey Vista Way, Knoxville, Tennessee 37920, USA., Li M; Massachusetts Institute of Technology, 77 Massachusetts Ave., Bldg. 24-209, Cambridge, Massachusetts 02139, USA., Liu X; 225 Nieuwland Science Center, University of Notre Dame, Notre Dame, Indiana 46556, USA., Liu Y; Second Target Station, Oak Ridge National Laboratory, 1 Bethel Valley Road, Oak Ridge, Tennessee 37831, USA., Moodera J; Massachusetts Institute of Technology, 77 Massachusetts Ave., Bldg. 24-209, Cambridge, Massachusetts 02139, USA., Rokhinson L; Department of Physics, Purdue University, West Lafayette, Indiana 47906, USA., Singh D; 223 Physics Building, Department of Physics and Astronomy, University of Missouri, Columbia, Missouri 65211, USA., Sun N; Electrical and Computer Engineering Department, Northeastern University, 360 Huntington Avenue, Boston, Massachusetts 02115, USA.
Publikováno v:
The Review of scientific instruments [Rev Sci Instrum] 2022 Oct 01; Vol. 93 (10), pp. 103903.
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.