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Autor:
Dennis G. Manzer, Dan Knebel, Steven E. Steen, Yuen Chan, Steve Wilson, Tony Pelella, B. Huott, Pia Naoko Sanda, Stas Polonsky, Moyra K. McManus
Publikováno v:
International Symposium for Testing and Failure Analysis.
Picosecond Imaging Circuit Analysis (PICA) is a new technique shown here to be applicable to the analysis of complex VLSI circuits. PICA was used to diagnose a timing failure in the early design of the G6 microprocessor chip. The fault occurred at hi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2f5a07c29e3b37a61b2203c76a603fd7
https://doi.org/10.31399/asm.cp.istfa1999p0035
https://doi.org/10.31399/asm.cp.istfa1999p0035
